Xiang Xue

Prof. Dr. Xiang Xue


Research Focus & Metrics

Academic Career Length

20Years (2007-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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19 October 2022 in Carbon
Verified
Journal Article
Closed access
SWShaojun Wu
Shaojun Wu
HHHongliang Hou
Hongliang Hou
XXXiang Xue
Xiang Xue


1 November 2014 in Transactions of Nonferrous Metals Society of China
Verified
Journal Article
Closed access
YWYe Wang
Ye Wang
SWShiping Wu
Shiping Wu
XXXiang Xue
Xiang Xue
RCRui-Run Chen
Rui-Run Chen
JZJian-Bing Zhang
Jian-Bing Zhang
WXWen-Feng Xiao
Wen-Feng Xiao

20 June 2022 in Materials Characterization
Verified
Journal Article
Closed access
YZYunfei Zheng
Yunfei Zheng
LXLijuan Xu
Lijuan Xu
ZCZhuo Chen
Zhuo Chen
XWXicheng Wang
Xicheng Wang
XXXiang Xue
Xiang Xue
YCYuyong Chen
Yuyong Chen


24 November 2016 in Metals
Verified
Journal Article
Open access
PDF file
HSHai Chao Sun
Hai Chao Sun
ZNZhiliang Ning
Zhiliang Ning
GWGang Wang
Gang Wang
WLWeizhong Liang
Weizhong Liang
Hongxian ShenHongxian Shen
Hongxian Shen
XXXiang Xue
Xiang Xue
Uniform Cu48Zr48Al4 amorphous microwires with a high surface quality are fabricated by a melt extraction technique. The mechanical property of microwires is evaluated via tensile tests. To estimate the strength scattering, statistical analysis of fracture strengths is conducted using logarithmic normal distribution, and two- and three-parameter Weibull analysis, severally. The results show that the tensile strengths of Cu48Zr48Al4 amorphous microwires range from 1724 to 1937 MPa with the arithmetical average value of 1836 MPa, and the arithmetical standard deviation of 56.4 MPa. The geometric mean of fracture strength is 1840 MPa using logarithmic normal distribution statistical analysis. Using two- and three-parameter Weibull analysis, the Weibull modulus and fracture threshold value are respectively calculated for 34.8 and 1483 MPa, which shows the excellent tensile mechanical properties with a high predictability of Cu48Zr48Al4 amorphous microwires and further indicates the great potential of application.