Lv Kehong

Dr. Lv Kehong


Research Focus & Metrics

Academic Career Length

9Years (2018-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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19 August 2020 in Micromachines
Verified
Journal Article
Open access
PDF file
Ying LiuYing Liu
Ying Liu
YZYong Zhang
Yong Zhang
XLXin Lin
Xin Lin
LKLv Kehong
Lv Kehong
PYPeng Yang
Peng Yang
GLGuan-jun Liu
Guan-jun Liu
Graphene with atomic thickness possesses excellent mechanical and electrical properties, which hold great potential for high performance pressure sensing. The exposed electron of graphene is always cross-sensitive to any pollution absorbed or desorbed on the surface, from which the long-term stability of the graphene pressure sensor suffers a lot. This is one of the main obstacles towards graphene commercial applications. In this paper, we utilized polymethylmethacrylate (PMMA)/graphene heterostructure to isolate graphene from the ambient environment and enhance its strength simultaneously. PMMA/graphene pressure sensors, with the finite-depth cavities and the through-hole cavities separately, were made for comparative study. The through-hole device obtained a comparable sensitivity per unit area to the state of the art of the bare graphene pressure sensor, since there were no leaking cracks or defects. Both the sensitivity and stability of the through-hole sensor are better than those of the sensor with 285-nm-deep cavities, which is due to the sealed gas effect in the pressure cavity. A modified piezoresistive model was derived by considering the pressure change of the sealed gas in the pressure cavity. The calculated result of the new model is consistent with the experimental results. Our findings point out a promising route for performance optimization of graphene pressure sensors.

15 August 2018 in Applied Sciences
Verified
Journal Article
Open access
PDF file
QLQian Li
Qian Li
LKLv Kehong
Lv Kehong
JQJing Qiu
Jing Qiu
GLGuanjun Liu
Guanjun Liu
Based on the dynamic properties of electrical connector intermittent failure, the model and methods for residual life prediction for electrical connectors are studied in this paper. Firstly, the mechanism of electrical connector intermittent failure is analyzed, and the area enclosed by the contact resistance curve and the fault threshold is defined as the generalized severity of intermittent failure to describe how severe the electrical connector’s intermittent failure is. Then, the Hidden Semi-Markov Model (HSMM) is introduced to build the residual life prediction model of the electrical connector. Further, the evaluation method of using the state and prediction method for residual life are studied. Finally, by carrying out the residual life prediction test, the effectiveness of the residual life prediction method for electrical connectors based on intermittent failure and HSMM is verified.

16 January 2026 in Applied Sciences
Verified
Journal Article
Open access
PDF file
KLKehong Lyu
Kehong Lyu
YZYong Zhang
Yong Zhang
XCXianzhe Cheng
Xianzhe Cheng
XLXinyu Luo
Xinyu Luo
GLGuanjun Liu
Guanjun Liu
LKLv Kehong
Lv Kehong
Focusing on the challenges posed by the strong randomness, weak manifestation, and difficulty in diagnosing intermittent faults (IFs) in high-density integrated circuits (HDICs)—often induced by bonding wire defects—this paper takes the GPIO interfaces of a typical DSP chip as the research object. It systematically analyzes the response characteristics of intermittent short-circuit and open-circuit faults and proposes a hybrid intelligent diagnosis method based on the Sparrow Search Algorithm-optimized Variational Mode Decomposition and Attention-based Support Vector Machine (SSA–VMD–Attention–SVM). A dedicated fault injection circuit is designed to accurately replicate IFs and acquire the power supply current response signals. The Sparrow Search Algorithm (SSA) is employed to adaptively optimize the parameters of Variational Mode Decomposition (VMD) for effective extraction of frequency-domain features from fault signals. A three-level attention mechanism is introduced to adaptively weight multi-domain features, thereby highlighting the key fault components. Finally, the Support Vector Machine (SVM) is utilized to achieve high-precision fault classification under small-sample conditions. Experimental results demonstrate that the proposed method achieves a diagnostic accuracy of 97.78% for intermittent short-circuit and open-circuit faults in the GPIO interfaces of the DSP chip, significantly outperforming traditional methods and exhibiting notable advantages in terms of diagnostic accuracy, robustness, and interpretability.