Electronic Double-Layer Capacitors (EDLC), called Supercapacitors (SC), are electronic devices that are capable to store a relatively high amount of energy in a small volume comparing to other types of capacitors. They are composed of an activated carbon layer and electrolyte solution. The charge is stored on electrodes, forming the Helmholtz layer, and in electrolyte. The capacitance of supercapacitor is voltage- dependent. We propose an experimental method, based on monitoring of charging and discharging a supercapacitor, which enables to evaluate the charge in an SC structure as well as the Capacitance-Voltage (C-V) dependence. The measurement setup, method and experimental results of charging/discharging commercially available supercapacitors in various voltage and current conditions are presented. The total charge stored in an SC structure is proportional to the square of voltage at SC electrodes while the charge on electrodes increases linearly with the voltage on SC electrodes. The Helmholtz capacitance increases linearly with the voltage bias while a sublinear increase of total capacitance was found. The voltage on SC increases after the discharge of electrodes due to diffusion of charges from the electrolyte to the electrodes. We have found that the recovery voltage value is linearly proportional to the initial bias voltage value.

In this paper, a new method, called the noise scattering pattern method (NSP method), for random telegraph signal noise identification in the inherent noise of semiconductor devices is described. A block diagram of a noise measurement system based on the NSP method is presented. Examples of patterns of the NSP method are included.

We proposed applying low-frequency (flicker) noise in proton-exchange membrane fuel cells under selected loads to assess their state of health. The measurement set-up comprised a precise data acquisition board and was able to record the DC voltage and its random component at the output. The set-up estimated the voltage noise power spectral density at frequencies up to a few hundred mHz. We observed the evolution of the electrical parameters of selected cells of different qualities. We confirmed that flicker noise intensity varied the most (more than 10 times) and preceded changes in the impedance or a drop in the output DC voltage (less than 2 times). The data were observed for current loads (from 0.5 to 32 A) far from the permissible load. We deduce that the method can be utilised in industrial conditions to monitor the state of health of the selected cells by noise analysis. The method can be used in real-time when the flicker noise is measured within the range of a few Hz and requires a reasonable amount of averaging time to estimate its power spectral density. The presented method of flicker noise measurement has considerable potential for use in innovative ways of fuel cell quality monitoring.

This article presents the qualitative analyses of the construction of supercapacitor samples. The analyses are based on the suggested thermographic measurements as well as the technique of testing the inherent noise of the investigated element. The indicated assessment methods have been referred to the currently used parameters for the qualitative evaluation of supercapacitors. The approach described in this paper, which introduces additional parameters assessing worn out of supercapacitors, can be included in the so-called non-invasive measurement methods, which allow the assessment of the condition of the sample under test. This article presents the applied measurement stands and verifies of the applicability of measurement methods in relation to the currently used parameters allowing for the qualitative assessment of supercapacitors. The measurement method presented in this article was used to study prototypes of supercapacitors. The measurement results allow for more accurate characterization of the observed element. Conducted tests revealed, at the same time, that one of the proposed evaluation methods, based on measurements of inherent noise of tested supercapacitors, is a method predicting their degradation.

A developed method and measurement setup for measurement of noise generated in a supercapacitor is presented. The requirements for noise data recording are considered and correlated with working modes of supercapacitors. An example of results of low-frequency noise measurements in commercially available supercapacitors are presented. The ability of flicker noise measurements suggests that they can be used to assess quality of tested supercapacitors.