Fatigue life prediction of electronic devices is of great importance in both research and industry. Traditionally, fatigue tests and finite element modeling (FEM) are the two main methods. This paper presents a new hybrid approach (FEM combined with artificial neural network, (ANN)) for fatigue life prediction. Finite element models on wafer-level chip scale packages (WLCSP) with different chip thickness, PCB thickness, and solder joint pitches were created to evaluate the effect of structure parameters on the increase in maximum creep strain under thermal fatigue load. Modified Coffin–Manson equation was then employed to estimate the corresponding fatigue life. ANNs were built, and then trained, tested, and optimized with the datasets from modeling to predict increase in maximum creep strain and fatigue life. For the ANN built for strain prediction, prediction accuracy of the optimal network was 97% in accuracy tests and 93% in generalization tests. Accuracy of the other ANN for predicting fatigue life was 94.2% in accuracy tests and 88% in generalization tests. This hybrid method shows very promising application in fatigue life estimation of electronic devices which requires much less time and lower cost.

Under alternating temperatures, the fatigue failure of solder balls caused by the mismatch of the thermal expansion coefficient is a key problem in a Ball Grid Array (BGA). However, the combined effects of the solder ball location and the size of voids within it can seriously affect the thermal fatigue reliability of BGA solder balls, which can be easily ignored by researchers. Firstly, the thermal fatigue reliability of the board-level solder balls was evaluated by a temperature cycling test of the BGA package at −20 °C–+125 °C. The experimental results showed that the thermal fatigue reliability of the outer ring’s solder joint was lower than that of the inner ring. Secondly, the reliability of the solder balls in the BGA package was studied under the same thermal cycling condition based on finite element analysis (FEA). The influences of voids on fatigue life were investigated. Generally, a linear correlation between the void content and the fatigue life of the inner rings’ solder balls could be identified with a gradually smoothed relationship for solder balls closer to the center. In addition, when the size of the void exceeded a critical volume, the inner ring’s solder ball with the void would fail before the outermost ring. The results of FEA showed that the critical void volume ratio from the second to fifth ring increased from 10.5% to 42.3%. This study provides a valuable reference for the influence of voids on the thermal fatigue reliability of BGA solder balls.

Rapid developments in wide-bandgap semiconductors have led to the demand for interconnection materials that can withstand harsh conditions. In this study, novel Ag composite pastes were developed with the assistance of metal organic decomposition (MOD) to significantly reduce the sintering temperature of commercial Ag pastes. The effects of the decomposition characteristics of different MODs on the microstructure, morphology, and the shear strength of the Ag-sintered joints were systematically investigated. Additionally, the low-temperature sintering mechanisms of the MOD-assisted Ag composite pastes were studied and proposed. Among all the MODs studied, the one consisting of propylamine complexed with silver oxalate demonstrated the best performance due to its ability to form Ag nanoclusters with the smallest size (~25 nm) and highest purity (~99.07 wt.%). Notably, the bonding temperature of the MOD-modified Ag pastes decreased from 250 °C to 175 °C, while the shear strength increased from 20 MPa to 40.6 MPa when compared to the commercial Ag pastes.

To meet the packaging requirements of sapphire in special electronic components, there is an urgent need for a joining process that can realize a good connection between sapphire and dissimilar metals at a low temperature. In this work, the surface of a sapphire substrate was successfully catalytically activated and metallized by an electroless nickel plating process. Moreover, the solderability and interconnection of metallized sapphire with Sn-based solders were evaluated and investigated at 250 °C, and the wetting angle of the Sn-based solders on sapphire on sapphire without and with metallization was 125° and 51°, respectively. The interfacial microscopic morphology and element distribution in the Cu/Sn-Ag solder/sapphire solder joints were analyzed. It was found that the middle solder layer has diffused during the reflow process, inferring good adhesion between sapphire and Cu substrate with the aid of the Ni-P deposition. Thus, a sapphire welding method with a simple process suitable for practical applications is demonstrated.

Epoxy molding compounds (EMCs) are commonly used in electronic products for chip encapsulation, but the moisture absorption of EMC can induce significant reliability challenges. In this study, the effects of hygrothermal conditions and structure parameters on moisture diffusion and the consequent influences (such as moisture content on die surfaces and stress distribution) on a system-in-package module have been systematically investigated by moisture–thermal–mechanical-coupled modeling. Hygroscopic tests were carried out on a new commercial EMC at 60 °C/60% RH and 85 °C/85% RH, followed by evaluations of diffusion coefficients by Fick’s law. It was found that the moisture diffusion coefficients and saturation concentrations at 85 °C/85% RH were higher than those at 60 °C/60% RH. From the modeling, it was found that the consequent maximum out-of-plane deformation and stress of the module at 85 °C/85% RH were both higher than those at 60 °C/60% RH. Influences of thicknesses of EMC and PCB on the moisture diffusion behavior have also been studied for design optimization. It was found that the maximum moisture concentration on die surfaces and resultant stress increased notably with thinner PCB, whereas the effects of EMC thickness were limited. This can be attributed to the comparison between the thicknesses of EMC and PCB and the shortest existing diffusion path within the module. These findings can provide helpful insights to the design optimization of electronic modules for hygrothermal conditions.