Zeyu Wu

Dr. Zeyu Wu


Research Focus & Metrics

Academic Career Length

9Years (2018-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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26 November 2022 in Energy
Verified
Journal Article
Closed access
QXQuan Xia
Quan Xia
Yi RenYi Ren
Yi Ren
ZWZili Wang
Zili Wang
Dezhen YangDezhen Yang
Dezhen Yang
PYPeiyu Yan
Peiyu Yan
CQCheng Qian
Cheng Qian

19 April 2022 in IEEE Transactions on Industrial Informatics
Verified
Journal Article
Closed access
BSBo Sun
Bo Sun
ZWZeyu Wu
Zeyu Wu
QFQiang Feng
Qiang Feng
ZWZili Wang
Zili Wang
Yi RenYi Ren
Yi Ren
QXQuan Xia
Quan Xia
The scarcity of time-series data constrains the accuracy of online reliability assessment. Data expansion is the most intuitive way to address this problem. However, conventional small-sample reliability evaluation methods either depend on prior knowledge or are inadequate for time series. This article proposes a novel autoaugmentation network, the worm Wasserstein generative adversarial network, which generates synthetic time-series data that carry realistic intrinsic patterns with the original data and expands a small sample without prior knowledge or hypotheses for reliability evaluation. After verifying the augmentation ability and demonstrating the quality of the generated data by manual datasets, the proposed method is demonstrated with an experimental case: the online reliability assessment of lithium battery cells. Compared with conventional methods, the proposed method accomplished a breakthrough in the online reliability assessment for an extremely small sample of time-series data and provided credible results.

30 October 2019 in IEEE Photonics Journal
Verified
Journal Article
Open access
MIMesfin Seid Ibrahim
Mesfin Seid Ibrahim
JFJiajie Fan
Jiajie Fan
WYWinco K.C. Yung
Winco K.C. Yung
ZWZeyu Wu
Zeyu Wu
BSBo Sun
Bo Sun

24 May 2018 in IEEE Transactions on Electron Devices
Verified
Journal Article
Closed access
ZWZeyu Wu
Zeyu Wu
ZWZili Wang
Zili Wang
QFQiang Feng
Qiang Feng
BSBo Sun
Bo Sun
Cheng QianCheng Qian
Cheng Qian
XJXiaopeng Jiang
Xiaopeng Jiang
The correlated color temperature (CCT) is one of the performance indicators of color shift failure of the high-power white light-emitting diodes (HPWLEDs). The prognostics for CCT shift of HPWLEDs using deterministic or statistical models usually generate a considerable amount of uncertainties by assuming the degradation model of CCT is a deterministic exponential function, which may not be accurate. To overcome this problem, a stochastic process model based on gamma process is established to present the distribution of CCT maintenance lifetime with the probability density function and the cumulative distribution function. The test data reported from LUXEON was used as an example to demonstrate the utilization of the gamma process model. The mean time to failure of which was proved to be more conservative than the L70 lifetime predicted by the conventional method. The CCT shift appears to have a period of nonmonotonic seasoning stage, whereas the gamma process is only applicable to the monotonic degradation. Aiming at this problem, a unified analytical method was established based on generalized Eyring model to estimate seasoning stage under various conditions. The results of which were proved to be reliable.

16 January 2025 in Reliability Engineering & System Safety
Verified
Journal Article
Closed access
XGXing Guo
Xing Guo
QFQiang Feng
Qiang Feng
ZWZeyu Wu
Zeyu Wu
MLMeng Liu
Meng Liu
YRYi Ren
Yi Ren
ZWZili Wang
Zili Wang

4 March 2026 in Reliability Engineering & System Safety
Verified
Journal Article
Closed access
YZYi Zechen
Yi Zechen
SBSun Bo
Sun Bo
ZWZeyu Wu
Zeyu Wu
ZLZhou Leyang
Zhou Leyang
LTLin Tongshu
Lin Tongshu