Andrea Campos has obtained the following: a Graduate in License de Physique Fondamentale - Université de Paris-Sud (1992), Maîtrise de Physique Fondamentale - Université Paris-Sud (1993), Master in Physique des Gaz et des Plasmas – Université Paris-Sud (1994), PhD in Physics - Fluminense Federal University (2002), Specialization in Criminal Forensics - Estácio de Sá University (2002), and Post-Doctorate at Institut de Physique et Chimie des matériaux de l’Université de Strasbourg (2013). Andrea Campos is an expert of the Rio de Janeiro Scientific Police (2001-2008), Researcher of the Brazilian Institute of Metrology (Inmetro) at the Electron Microscopy Laboratory (2008-2015), and Research Engineer at the Centre Pluridisciplinaire de Microscopie Electronique et Microanalyse (2015 – present date). Andrea Campos's fields of research are the following: scanning electron microscopy (SEM) and related techniques (EDS, WDS, EBSD, and TKD) and transmission electron microscopy (TEM) and associated techniques (EDS and EELS) applied to nanoscience and nanotechnology. Campos is a member of the Brazilian Society of Physics, the French Microscopy Society, and the Scientific Council of Aix-Marseille University.
Andrea Campos has obtained the following: a Graduate in License de Physique Fondamentale - Université de Paris-Sud (1992), Maîtrise de Physique Fondamentale - Université Paris-Sud (1993), Master in Physique des Gaz et des Plasmas – Université Paris-Sud (1994), PhD in Physics - Fluminense Federal University (2002), Specialization in Criminal Forensics - Estácio de Sá University (2002), and Post-Doctorate at Institut de Physique et Chimie des matériaux de l’Université de Strasbourg (2013). Andrea Campos is an expert of the Rio de Janeiro Scientific Police (2001-2008), Researcher of the Brazilian Institute of Metrology (Inmetro) at the Electron Microscopy Laboratory (2008-2015), and Research Engineer at the Centre Pluridisciplinaire de Microscopie Electronique et Microanalyse (2015 – present date). Andrea Campos's fields of research are the following: scanning electron microscopy (SEM) and related techniques (EDS, WDS, EBSD, and TKD) and transmission electron microscopy (TEM) and associated techniques (EDS and EELS) applied to nanoscience and nanotechnology. Campos is a member of the Brazilian Society of Physics, the French Microscopy Society, and the Scientific Council of Aix-Marseille University.