Stochastic processes are highly relevant in research fields as different as neuroscience, economy, ecology, chemistry, and fundamental physics. However, due to their intrinsic unpredictability, stochastic mechanisms are very challenging for any kind of investigations and practical applications. Here we report the deliberate use of stochastic X-ray pulses in two-dimensional spectroscopy to the simultaneous mapping of unoccupied and occupied electronic states of atoms in a regime where the opacity and transparency properties of matter are subject to the incident intensity and photon energy. A readily transferable matrix formalism is presented to extract the electronic states from a dataset measured with the monitored input from a stochastic excitation source. The presented formalism enables investigations of the response of the electronic structure to irradiation with intense X-ray pulses while the time structure of the incident pulses is preserved.

For incident x-ray energies below the core level ionization threshold, one-photon absorption (OPA) leads to off-resonant x-ray excitations that are mediated by a virtual intermediate electronic state. In the linear regime of x-ray interaction, this intermediate state may decay radiatively and the maximum energy of the emitted photon is given by the initial and final atomic state as well as the energy of the incident photon. In the nonlinear excitation regime, however, this intermediate state may be depleted by a second x-ray absorption process as described in the sequential two-photon absorption (TPA) mechanism. Since the same intermediate state is involved in the OPA and TPA processes, the cross-section values for OPA and TPA are interconnected. We report on the determination of cross-section values for off-resonant excitation conditions, and show how the data can be used for estimating the TPA cross section in the sequential absorption mechanism. The determined off-resonant cross sections for cobalt exhibit a Lorentz-like energy-dependent behavior allowing for an energy-dependent description of the OPA and TPA cross sections with semiempirical models. The dependence of TPA cross sections on atomic number is discussed and different scaling laws are investigated. The effect of the lifetimes of a virtual intermediate state is also studied in relation to the incidence x-ray energy.

In this paper, we demonstrated how high energy resolution resonant X-ray emission spectroscopy can be employed to study the charge transfer dynamics in real-time during the temperature-induced oxidation of metallic tungsten.