Yellow luminescence (YL) of unintentionally doped GaN (u-GaN) peaking at about 2.2 eV has been investigated for decades, but its origin still remains controversial. In this study, ten u-GaN samples grown via metalorganic chemical vapor deposition (MOCVD) are investigated. It is observed from the room temperature (RT) photoluminescence (PL) measurements that the YL band is enhanced in the PL spectra of those samples if their MOCVD growth is carried out with a decrease of pressure, temperature, or flow rate of NH₃. Furthermore, a strong dependence of YL band intensity on the carbon concentration is found by secondary ion mass spectroscopy (SIMS) measurements, demonstrating that the increased carbon-related defects in these samples are responsible for the enhancement of the YL band.

Both yellow luminescence (YL) and blue luminescence (BL) bands of GaN films have been investigated for decades, but few works report the relationship between them. In this study, two sets of GaN samples grown via metalorganic chemical vapor deposition (MOCVD) were investigated. A close relationship was found between the YL and BL bands for unintentionally doped GaN and Si-doped GaN samples, both of which were grown without intentional acceptor doping. It was found that the intensity ratio of blue luminescence to yellow luminescence (I_BL/I_YL) decreases sharply with the increase in carbon impurity concentration, even though both I_BL and I_YL increase obviously. It was also found that I_BL/I_YL decreases sharply with the increase in Si doping concentration. It is suggested that the C and Si impurities play important role in linkage and competition of the blue and yellow luminescence.

The InGaN/GaN multi-quantum wells (MQWs) are prepared at the same condition by metal-organic chemical vapor deposition (MOCVD) except the thickness of cap layers additionally grown on each InGaN well layer. The photoluminescence (PL) intensity of the thin cap layer sample is much stronger than that of thicker cap layer sample. Interestingly, the thick cap layer sample has two photoluminescence peaks under high excitation power, and the PL peak energy-temperature curves show an anomalous transition from reversed V-shaped to regular S-shaped with increasing excitation power. Meanwhile, it exhibits a poorer thermal stability of thick cap layer sample under higher excitation power than that under lower excitation power. Such an untypical phenomenon is attributed to carrier redistribution between the two kinds of localized states which is induced by the inhomogeneous distribution of indium composition in thick cap layer sample. Furthermore, the luminescence of deep localized states has a better thermal stability, and the luminescence of shallow localized states has a poor thermal stability. In fact, such a severer inhomogeneous indium distribution may be caused by the degradation of subsequent epitaxial growth of InGaN/GaN MQWs region due to longer low-temperature GaN cap layer growth time.

The performance of ultraviolet (UV) laser diodes (LDs) with a low Al mole fraction AlGaN cladding layer was investigated by varying the thicknesses of the waveguide layer. It is found that (1) the loss of carriers in the waveguide layer is much larger than that in blue or green LDs due to the shallower quantum well and consequently a weaker carrier confinement of UV lasers. (2) Carrier loss in the waveguide layer can be suppressed by using a thinner waveguide layer. Therefore, the threshold current of LDs can be reduced. (3) The ultraviolet GaN/AlGaN single quantum well laser diodes lasing at 366 nm are fabricated by using relatively thin AlGaN waveguide layers and low Al mole fraction AlGaN cladding layers.

We investigated the cavity facet degradation of unsealed GaN-based laser diodes (LDs). It was found that the decrease of optical output power accompanied by undulation for unsealed LDs is related to the facet degradation. Deposits containing Ga, Al, Si, and O were observed on the LD facet for the first time, explaining the reason for the degradation behavior. Considering the shorter wavelength of GaN-based laser diodes, we propose that the splitting of water molecules induced by high-energy photons triggers the oxidation of the facets and the deposition of SiO₂. The shape of the deposits is closely correlated with the field distribution on the facet, influencing the LDs’ output power. Improving the tightness of the package is necessary to avoid the fast degradation of GaN-based LDs.