Chulmin Oh

Dr. Chulmin Oh

orcid

Research Focus & Metrics

Academic Career Length

17Years (2010-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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30 April 2019 in Journal of Welding and Joining
Verified
Journal Article
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MKMi-Song Kim
Mi-Song Kim
COChulmin Oh
Chulmin Oh
WHWON SIK HONG
WON SIK HONG

18 November 2019 in Journal of Materials Science: Materials in Electronics
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Journal Article
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COChulmin Oh
Chulmin Oh
YCYoonhwa Choi
Yoonhwa Choi
DKDajung Kim
Dajung Kim
MWMiso Won
Miso Won
HYHyunseung Yang
Hyunseung Yang
WHWonsik Hong
Wonsik Hong

3 December 2017 in Metals
Verified
Journal Article
Open access
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YPYujin Park
Yujin Park
JBJunghwan Bang
Junghwan Bang
COChulmin Oh
Chulmin Oh
WHWON SIK HONG
WON SIK HONG
Namhyun KangNamhyun Kang
Namhyun Kang
Solder joints are the main weak points of power modules used in harsh environments. For the power module of electric vehicles, the maximum operating temperature of a chip can reach 175 °C under driving conditions. Therefore, it is necessary to study the high-temperature reliability of solder joints. This study investigated the creep properties of Sn-3.0Ag-0.5Cu (SAC305) and Sn-8.0Sb-3.0Ag (SSA8030) solder joints. The creep test was conducted at 175 and 190 °C with the application of 2.45 MPa. The SAC305 solder had superior creep properties to those of SSA8030 solder at 175 °C and at largely the same homologous temperature ( T H ~0.91 for SAC305 and T H ~0.92 for SSA8030). Both solders had primary β-Sn and a eutectic mixture of β-Sn and Ag3Sn. Compared to SSA8030, the SAC305 solder contained ~10% more eutectic structure and contained Ag3Sn that was 3 times smaller and more round in shape. Furthermore, the SSA8030 solder precipitated SnSb in an elongated fiber shape (1–50 μm in size) after the creep test. Coarse and elongated Ag3Sn and SnSb of the SSA8030 solder negatively affected crack propagation in the dislocation creep region and decreased the creep resistance.

17 July 2023 in Energies
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Journal Article
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MWMiso Won
Miso Won
DKDajung Kim
Dajung Kim
HYHyunseung Yang
Hyunseung Yang
COChulmin Oh
Chulmin Oh
To preserve the structural integrity of power semiconductor devices, ensuring a reliable connection between wide-bandgap (WBG) chips and their substrates at temperatures above 200 °C is crucial. Therefore, easily processable chip-attach materials with high bonding strengths at high temperatures should be developed. Herein, we determined the optimal pre-heating conditions of chip-attach materials to achieve highly reliable WBG semiconductor devices. Sintering with silver-coated copper (Cu@Ag) particle paste was investigated as a model system for chip attachment in electric power devices. After printing the paste onto a direct-bonded ceramic substrate and placing the Si chip on the paste, the pre-heating process was conducted at 50 and 70 °C for different periods of time. Finally, the samples were sintered at a pressure of 9 MPa at 250 °C in an N2 atmosphere for 1 h. The quality of the obtained Cu@Ag joints significantly varied depending on the pre-heating temperature and time. When Cu@Ag joints were pre-heated at 50 °C, more reliable and reproducible bonding was achieved than at 70 °C. In particular, high-quality sintered joints were obtained with a pre-heating time of 4 min. However, after excessive pre-heating time, cracks and voids were generated impacting negatively the performance of the sintered joints.

4 February 2025 in Journal of Materials Science: Materials in Electronics
Verified
Journal Article
Closed access
PDF file
MWMiso Won
Miso Won
DKDajung Kim
Dajung Kim
HYHyunseung Yang
Hyunseung Yang
COChulmin Oh
Chulmin Oh

1 September 2010 in Microelectronics Reliability
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Journal Article
Closed access
CHChangwoon Han
Changwoon Han
COChulmin Oh
Chulmin Oh
NPNochang Park
Nochang Park
WHWonsik Hong
Wonsik Hong