We present a method for the quantitative determination of the photon force (PF)—the force generated by the radiation pressure of photons reflected from the surface. We propose an experimental setup integrating innovative microelectromechanical system (MEMS) optimized for the detection of photon force (pfMEMS). An active microcantilever was used as the force detector, while the measurement was conducted in a closed-loop setup with electromagnetic force compensation. In opposition to our previous works, this measurement method provides quantitative not qualitative assessment of PF interaction. Final current-balance setup is suitable for light sources from tens of microwatts to few watts. In our article, we present the results of the performed experiments, in which we measured the PF interactions in the range up to 67.5 pN with resolution of 30 fN in the static measurement.

The exact pull-in threshold for single-degree-of-freedom actuator models arising in the design of micro-electro-mechanical systems (MEMS) is derived analytically by studying exact solutions to trinomial equations of arbitrary degree. In the case of magnetic actuation (magMEMS), the exact pull-in threshold is expressed in terms of the Lambert W function, while in the case of actuation inversely proportional to the positive power of distance, the closed form of the dynamic pull-in threshold is expressed in terms of infinite series or Gaussian hypergeometric functions. Periodic and pull-in solutions for various excitation parameters and actuation exponents are numerically illustrated.

In following paper we propose method of energetic description for active microcantilevers. Microelectromechanical devices (MEMS), to which the microcantilevers belong, are becoming part of energy generation and transformation systems. Therefore efficiency of said devices becomes significant parameter. In our approach we described the method to estimate the efficiency based on the measured parameters of a cantilever and it’s effective movement under actuation. We have conducted measurements an calculations for series of cantilevers actuated electrothermally and electromagnetically. Acquired results are in line with predicted properties of examined MEMS’. Method is suited for description of microcantilevers, assessment of utility and comparison in case of common application. [2022-0043]

The quantitative assessment of the image quality produced by atomic force microscopy (AFM) is an ongoing and challenging task. In our study, we demonstrate Shannon’s application of information theory for measuring image quality. Specifically, we propose quantifying the loss of image information due to the various distortion processes by exploring the relationship between image information based on the information channel capacity (ICC), spectral image representation, and visual quality. Since the ideal image is unavailable, the power and noise spectrum, the critical input information for the image quality evaluation, must be robustly estimated in the proposed method. The classical, most popular Welch method for spectral estimation uses an average of several windowed periodograms and can produce biased spectrum estimates. Therefore, in our work, we discuss an alternative technique based on the wavelet transform that can be applied to solve this challenging problem, specifically in the case of noisy, uncertain AFM measurements. Finally, we validate the performance of the enhanced ICC-wavelet-based algorithm with noisy measurement AFM data.

The measurement method, which utilizes nanomanipulation of the nanowires onto a specially prepared substrate, was presented. It introduced a four-point resistance measurement setup on a chip suited for scanning probe microscopy measurements, integrating connectors and a nanowire specimen. A study on the resistance and resistivity of the thermally post-treated ZnO nanowires at 200 °C and 300 °C in air showed the dependence of these electrical parameters on the annealing temperature. The investigations of the electrical properties of blocks built on the basis of nanowires and their related devices could provide a useful guide not only for designing, fabricating and optimizing electromechanical nanodevices based on nanowires but also for their safe operation in future electronic applications.