With the rapid development of laser medicine, there are higher requirements placed on the performance of optical components in various medical systems. This paper is aimed at exploring the critical optical devices of medical equipment for treating periodontitis and gingivitis. The cathode sputtering method was used to produce the wide-angle short-wave pass filter, and a hundreds grid fastness test was conducted to detect the occurrence of film peeling. Considering the results of SEM, transmission spectrum, and stress test of the sample, an analysis was conducted as to the cause of poor bonding force for the film. By increasing the amount of argon gas and adjusting the baking temperature, the problem of film peeling was resolved. Besides, a short-wave pass filter film with good bonding and low roughness was obtained to meet the requirements of laser medical equipment.

Optical coherence tomography is a new promising chromatographic imaging technique with the advantages of noncontact and high resolution without damage, which is widely used in the field of biological tissue detection and imaging. As an important optical element in the system, the wide-angle depolarizing reflector plays a key role in the accurate acquisition of optical signals. Ta₂O₅ and SiO₂ are selected as the coating materials for the technical parameter requirements of the reflector in the system. Based on the basic theory of optical thin film and combined with MATLAB and OptiLayer software, the design of 0~60° incident 1064 ± 40 nm depolarizing reflective film is realized by establishing the evaluation function of the film system. To optimize the oxygen-charging distribution scheme during film deposition, the weak absorption properties of the film materials are characterized by optical thermal co-circuit interferometry. According to the sensitivity distribution of the film layer, the optical control monitoring scheme with a thickness error of less than 1% is designed rationally. “Crystal control + optical control” is used to precisely control the thickness of each film layer and complete the preparation of resonant cavity film. The measurement results show that the average reflectance is more than 99.5%, and the deviation of P-light and S-light is less than 1% in the 1064 ± 40 nm wavelength band range from 0° to 60°, which meets the requirements of optical coherence tomography system.

Yellow lasers have attracted much attention due to their applications in biomedicine, astronomy and spectroscopy, and the resonant cavity is an important part of lasers. In this work, the resonant cavity film was studied and prepared using physical vapor deposition (PVD) technology to couple and match the optical properties of Dy,Tb:LuLiF₄ crystal to generate yellow laser. In the process of film deposition, the substrate temperature has an important influence on the quality of the film. Therefore, we first investigated the effect of HfO₂ film quality at different substrate temperatures. Furthermore, the multilayer film was designed to couple and match the optical properties of Dy,Tb:LuLiF₄ crystal. According to the designed film system scheme, HfO₂ and UV-SiO₂ were used as high- and low-refractive index film materials for resonant cavity film preparation using the PVD technique, and the effect of process parameters on the film quality was investigated. A 450 nm pump laser was used to directly pump Dy³⁺ to excite and generate the yellow laser. In this process, the excited radiation jump occurs in the crystal, and the generated laser in the new band reaches a certain threshold after oscillation and gain in the resonant cavity, thus successfully outputting a 575 nm yellow laser.

Crystal coating is an important process in laser crystal applications. According to the crystal characteristics of neodymium-doped yttrium vanadate (Nd:YVO₄), its intrinsic parameters, and optical film design theory, Ta₂O₅ and SiO₂ were selected separately as high and low refractive index materials. The optical properties and surface roughness of the films were characterized by OptiLayer and Zygo interferometers, and the effects of ion source bias on refractive index and surface roughness were investigated so that the optimal ion source parameters were determined. Optical monitoring and quartz crystal control were combined to accurately control the thickness of each film layer and to reduce the monitoring error of film thickness. The prepared crystal device was successfully applied to the 1176 nm laser output system.