Ridwanullahi Oluwakayode Isa

Mr. Ridwanullahi Oluwakayode Isa


Research Focus & Metrics

Academic Career Length

4Years (2023-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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19 August 2023 in Micromachines
Verified
Journal Article
Open access
PDF file
RIRidwanullahi Oluwakayode Isa
Ridwanullahi Oluwakayode Isa
Muhammad Jawad MirzaMuhammad Jawad Mirza
Muhammad Jawad Mirza
Salman GhafoorSalman Ghafoor
Salman Ghafoor
MKMohammed Zahed Mustafa Khan
Mohammed Zahed Mustafa Khan
Khurram Karim QureshiKhurram Karim Qureshi
Khurram Karim Qureshi
Recent advancements in power electronic switches provide effective control and operational stability of power grid systems. Junction temperature is a crucial parameter of power-switching semiconductor devices, which needs monitoring to facilitate reliable operation and thermal control of power electronics circuits and ensure reliable performance. Over the years, various junction temperature measurement techniques have been developed, engaging both non-optical and optical-based methods, highlighting their advancements and challenges. This review focuses on several optical sensing-based junction temperature measuring techniques used for power-switching devices such as metal-oxide-semiconductor field-effect transistors (MOSFETs) and insulated-gate bipolar transistors (IGBTs). A comprehensive summary of recent developments in infrared camera (IRC), thermal sensitive optical parameter (TSOP), and fiber Bragg grating (FBG) temperature sensing techniques is provided, shedding light on their merits and challenges while providing a few possible future solutions. In addition, calibration methods and remedies for obtaining accurate measurements are discussed, thus providing better insight and directions for future research.

4 December 2024 in Applied Sciences
Verified
Journal Article
Open access
PDF file
RIRidwanullahi Oluwakayode Isa
Ridwanullahi Oluwakayode Isa
NINaveed Iqbal
Naveed Iqbal
Mohamed AbidoMohamed Abido
Mohamed Abido
Muhammad Jawad MirzaMuhammad Jawad Mirza
Muhammad Jawad Mirza
Khurram Karim QureshiKhurram Karim Qureshi
Khurram Karim Qureshi
This study investigates the feasibility of using fiber Bragg grating (FBG) sensors for multipoint thermal monitoring of several power semiconductor devices (PSDs), such as insulated gate bipolar transistors (IGBTs), and rectifiers assembled on a common heatsink in a three-phase inverter. A novel approach is proposed to integrate FBG sensors beneath the baseplates of the IGBT modules, avoiding the need for invasive modifications to the device structure. By strategically positioning multiple FBG sensors, accurate temperature profiles of critical components can be obtained. The experimental results demonstrate the effectiveness of the proposed method, with the temperature measurements from FBG sensors closely matching those obtained using thermal infrared (IR) cameras within ±1.1 °C. This research highlights the potential of FBG sensors for reliable and precise thermal management in power electronic systems, contributing to improved performance and reliability.