Steffen Nothelfer

Mr. Steffen Nothelfer


Research Focus & Metrics

Academic Career Length

9Years (2018-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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14 September 2018 in Journal of Biomedical Optics
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Journal Article
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SNSteffen Nothelfer
Steffen Nothelfer
FBFlorian Bergmann
Florian Bergmann
ALAndré Liemert
André Liemert
DRDominik Reitzle
Dominik Reitzle
AKAlwin Kienle
Alwin Kienle
A method to correct for surface scattering in spatial frequency domain imaging (SFDI) is presented. The use of a modified analytical solution of the radiative transfer equation allows calculation of the reflectance and the phase of a rough semi-infinite geometry so that both spatial frequency domain reflectance and phase can be applied for precise retrieval of the bulk optical properties and the surface scattering. For validation of the method, phantoms with different surface roughness were produced. Contrarily, with the modified theory, it was possible to dramatically reduce systematic errors due to surface scattering. The evaluation of these measurements with the state-of-the-art theory and measuring modality, i.e., using crossed linear polarizers, reveals large errors in the determined optical properties, depending on the surface roughness, of up to ≈100 % . These results were confirmed with SFDI measurements on a phantom that has a structured rough surface.

14 September 2023 in Sensors
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Journal Article
Open access
PDF file
SLStefan Andreas Lohner
Stefan Andreas Lohner
SNSteffen Nothelfer
Steffen Nothelfer
AKAlwin Kienle
Alwin Kienle
Spatial frequency domain imaging (SFDI) is well established in biology and medicine for non-contact, wide-field imaging of optical properties and 3D topography. Especially for turbid media with displaced, tilted or irregularly shaped surfaces, the reliable quantitative measurement of diffuse reflectance requires efficient calibration and correction methods. In this work, we present the implementation of a generic and hardware independent calibration routine for SFDI setups based on the so-called pinhole camera model for both projection and detection. Using a two-step geometric and intensity calibration, we obtain an imaging model that efficiently and accurately determines 3D topography and diffuse reflectance for subsequently measured samples, taking into account their relative distance and orientation to the camera and projector, as well as the distortions of the optical system. Derived correction procedures for position- and orientation-dependent changes in spatial frequency and intensity allow the determination of the effective scattering coefficient μs′ and the absorption coefficient μa when measuring a spherical optical phantom at three different measurement positions and at nine wavelengths with an average error of 5% and 12%, respectively. Model-based calibration allows the characterization of the imaging properties of the entire SFDI system without prior knowledge, enabling the future development of a digital twin for synthetic data generation or more robust evaluation methods.