TienDung Vu

Dr. TienDung Vu

School of Mechanical Engineering, Hanoi University of Science and Technology, Hanoi, Hà Nội, Vietnam
orcid

Research Focus & Metrics

Academic Career Length

8Years (2019-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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6 October 2022 in Interdisciplinary Neurosurgery
Verified
Journal Article
Open access
CKCuc Nguyen Thi Kim
Cuc Nguyen Thi Kim
CBCao Xuan Binh
Cao Xuan Binh
TienDung VuTienDung Vu
TienDung Vu
TTThang Vu Toan
Thang Vu Toan

12 June 2024 in Thin-Walled Structures
Verified
Journal Article
Closed access
SNSon H. Nguyen
Son H. Nguyen
TienDung VuTienDung Vu
TienDung Vu
QPQuoc Hoa Pham
Quoc Hoa Pham
Trung Nguyen-ThoiTrung Nguyen-Thoi
Trung Nguyen-Thoi

2 April 2025 in Acta Mechanica
Verified
Journal Article
Closed access
PDF file
SNSon H. Nguyen
Son H. Nguyen
THThuan N.-T. Ho
Thuan N.-T. Ho
QLQui X. Lieu
Qui X. Lieu
TienDung VuTienDung Vu
TienDung Vu
Trung Nguyen-ThoiTrung Nguyen-Thoi
Trung Nguyen-Thoi

27 January 2025 in Optics Letters
Verified
Journal Article
Closed access
HVHuy Vu
Huy Vu
TienDung VuTienDung Vu
TienDung Vu
We propose an iterative optimization approach for wavefront reconstruction in a rotational shearing interferometer based on Zernike polynomials. Two incorrect shearing amounts are optimized simultaneously, enabling the absolute reconstruction of wavefronts with high uniformity in the root mean square (RMS). Simulations under noisy conditions show that the reconstruction error, in terms of peak-to-valley (PV) and RMS, remains within the μλ range. The approach was experimentally validated by identifying asymmetric aberrations in an imperfectly collimated light source, showing strong agreement with the wavefront obtained from a Shack–Hartmann sensor.

14 September 2023 in Mathematics
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Journal Article
Open access
PDF file
DNDuy Thai Nguyen
Duy Thai Nguyen
CKCUc nguyen thi kim
CUc nguyen thi kim
CBCao Binh
Cao Binh
VTVan-Thuc TRAN
Van-Thuc TRAN
TienDung VuTienDung Vu
TienDung Vu
Ngoc-Tam BUINgoc-Tam BUI
Ngoc-Tam BUI
Deflectometry is a non-destructive, full-field phase measuring method, which is usually used for inspecting optical specimens with special characteristics, such as highly reflective or specular surfaces, as well as free-form surfaces. One of the important steps in the Deflectometry method is to retrieve the surface from slope data of points on the sample map or surface reconstruction. This paper proposes a modal reconstruction method using an adjustable number of Zernike polynomials. In addition, the proposed method enables the analyses on practical surfaces that require an infinite number of Zernike terms to be represented. Experiments on simulated surfaces indicated that the algorithm is able to reveal the number of major-contributing Zernike terms, as well as reconstruct the surface with a micrometer-scale from slope data with a signal-to-noise ratio of 10.

26 August 2024 in IEEE Photonics Technology Letters
Verified
Journal Article
Closed access
TienDung VuTienDung Vu
TienDung Vu
HVHuy Vu
Huy Vu
A novel approach for wavefront reconstruction in rotational shearing interferometer is proposed. The correlation between the original and rotational wavefront is represented in matrix formalism, and the Zernike coefficient of the original wavefront is calculated from the interferogram wavefront through this matrix. We demonstrated the reconstruction ability of the method is efficient with negligible reconstruction errors by simulation. Experimental validation through the self-crosscheck property is introduced to indicate a uniform aberration of our collimator with high agreement.