Low Earth orbit missions have become crucial for a variety of applications, from scientific research to commercial purposes. Exposure to ionizing radiation in Low Earth Orbit (LEO) poses a significant risk to both spacecraft and astronauts. In this article, we analyze radiation data obtained from different LEO missions to evaluate the potential of using electronic commercial off-the-shelf (COTS) devices in space missions. This study is focused on the total ionizing dose (TID). Our results demonstrate that COTS technology can effectively provide cost-effective and reliable solutions for space applications. Furthermore, we compare the data obtained from actual missions with computational models and tools, such as SPENVIS, to evaluate the accuracy of these models and enhance radiation exposure prediction. This comparison provides valuable insights into the true radiation environment in space and helps us to better understand the potential of COTS technology in reducing costs and development times by utilizing technology previously used in other areas. In light of the results, we can see that the radiation values observed experimentally in space missions versus the computer simulations used present variations up to a factor of 30 depending on the model used in the analysis.

Ionizing radiation can disturb electrical and electronic devices. These devices need to be tested and qualified to operate under special environment conditions such those present in nuclear or space applications. Radiation effects must be considered when designing systems that must have high mean time between failures and are exposed to radiation. This paper shows how common radiotherapy linear accelerators (LINAC) can be used to characterize the Total Ionizing Dose (TID) effects on electronic devices. This work presents the principal radiation-induced effects on a Raspberry Pi Compute Module board, as good representative of typical Commercial Off-The-Shelf components. The Monte Carlo method used and the procedure for TID characterization are shown.