Photonic structures operating in the terahertz (THz) spectral region enable the essential characteristics of confinement, modal control, and electric field shielding for very high gradient accelerators based on wakefields in dielectrics. We report here an experimental investigation of THz wakefield modes in a three-dimensional photonic woodpile structure. Selective control in exciting or suppressing of wakefield modes with a nonzero transverse wave vector is demonstrated by using drive beams of varying transverse ellipticity. Additionally, we show that the wakefield spectrum is insensitive to the offset position of strongly elliptical beams. These results are consistent with analytic theory and three-dimensional simulations and illustrate a key advantage of wakefield systems with Cartesian symmetry: the suppression of transverse wakes by elliptical beams.

We report experimental measurements of narrow-band, single-mode excitation, and drive beam energy modulation, in a dielectric wakefield accelerating structure with planar geometry and Bragg-reflector boundaries. A short, relativistic electron beam ($\sim 1\mathrm{ps}$) with moderate charge ($\sim 100\mathrm{pC}$) is used to drive the wakefields in the structure. The fundamental mode of the structure is reinforced by constructive interference in the alternating dielectric layers at the boundary, and is characterized by the spectral analysis of the emitted coherent Cherenkov radiation signal. Data analysis shows a narrow-band peak at 210 GHz corresponding to the fundamental mode of the structure. Simulations in both 2D and 3D provide insight into the propagating fields and reproduction of the electron beams dynamics observables and emitted radiation characteristics.

We present an ultracompact plasma-based method to measure spatial and temporal concurrence of intense electron and laser beams nonintrusively at their interaction point. The electron beam couples with a laser-generated seed plasma in dependence of spatiotemporal overlap, which triggers additional plasma production and manifests as enhanced plasma afterglow. This optical observable is exploited to measure beam concurrence with $\sim 4\mu \mathrm{m}$ spatial and $\sim 26.7\mathrm{fs}$ temporal accuracy, supported by auxiliary diagnostics. The afterglow interaction fingerprint is highly sensitive and enables ultraversatile femtosecond-micrometer beam metrology.

Observation of ultrawide bandwidth, up to 15% full-width, high-gain operation of a self-amplified spontaneous emission free-election laser (SASE FEL) is reported. This type of lasing is obtained with a strongly chirped beam ($\delta E/E\sim 1.7\%$) emitted from the accelerator. Because of nonlinear pulse compression during transport, a short, high current bunch with strong mismatch errors is injected into the undulator, giving high FEL gain. Start-to-end simulations reproduce key features of the measurements and provide insight into mechanisms, such as angular spread in emitted photon and electron trajectory distributions, which yield novel features in the radiation spectrum.

We report the development of a multileaf collimator (MLC) for charged particle beams, based on independently actuated tungsten strips that can selectively scatter unwanted particles. The MLC is used in conjunction with an emittance exchange beamline to rapidly generate highly variable longitudinal bunch profiles. The developed MLC consists of 40 independent leaves that are 2 mm wide and can move up to 10 mm and operates in an ultrahigh vacuum environment, enabled by novel features such as magnetically coupled actuation. An experiment at the Argonne Wakefield Accelerator, which previously used inflexible, laser-cut masks for beam shaping before an emittance exchange beamline, was conducted to test functionality. The experiment demonstrated myriad transverse mask silhouettes, as measured on a scintillator downstream of the MLC, and the corresponding longitudinal profiles after emittance exchange, as measured using a transverse-deflecting cavity. Rapidly changing between mask shapes enables expeditious execution of various experiments without the downtime associated with traditional methods. The many degrees of freedom of the MLC can enable the optimization of experimental figures of merit using feed-forward control and advanced machine learning methods.

Recently, considerable work has been directed at the development of an ultracompact X-ray free-electron laser (UCXFEL) based on emerging techniques in high-field cryogenic acceleration, with attendant dramatic improvements in electron beam brightness and state-of-the-art concepts in beam dynamics, magnetic undulators, and X-ray optics. A full conceptual design of a 1 nm (1.24 keV) UCXFEL with a length and cost over an order of magnitude below current X-ray free-electron lasers (XFELs) has resulted from this effort. This instrument has been developed with an emphasis on permitting exploratory scientific research in a wide variety of fields in a university setting. Concurrently, compact FELs are being vigorously developed for use as instruments to enable next-generation chip manufacturing through use as a high-flux, few nm lithography source. This new role suggests consideration of XFELs to urgently address emerging demands in the semiconductor device sector, as identified by recent national need studies, for new radiation sources aimed at chip manufacturing. Indeed, it has been shown that one may use coherent X-rays to perform 10–20 nm class resolution surveys of macroscopic, cm scale structures such as chips, using ptychographic laminography techniques. As the XFEL is a very promising candidate for realizing such methods, we present here an analysis of the issues and likely solutions associated with extending the UCXFEL to harder X-rays (above 7 keV), much higher fluxes, and increased levels of coherence, as well as methods of applying such a source for ptychographic laminography to microelectronic device measurements. We discuss the development path to move the concept to rapid realization of a transformative XFEL-based application, outlining both FEL and metrology system challenges.