Cytology is the study of whole cells in diagnostic pathology. Unlike standard histologic thinly sliced specimens, cytologic preparations consist of preparations of whole cells where cells commonly cluster and aggregate. As such, cytology preparations are generally much thicker than histologic slides, resulting in large patches of defocus when examined under the microscope. A diagnostic aggregate of cells often cannot be viewed in focus together, requiring pathologists to continually manipulate the focal plane, complicating the task of accurately assessing the entire cellular aggregate and thus in making a diagnosis. Further, it is extremely difficult to acquire useful uniformly in-focus digital images of cytology preparations for applications such as remote diagnostic evaluations and artificial intelligence models. The predominant current method to address this issue is to acquire digital images at multiple focal planes of the entire slide, which demands long scanning time, complex and expensive scanning systems, and huge storage capacity. Here we report a unique imaging method that can acquire cytologic images efficiently and computationally render all-in-focus digital images that are highly compact. This method applies a metric-based digital refocusing to microscopy data collected with a Fourier ptychographic microscope (FPM). The digitally refocused patches of images are then synthesized into an all-in-focus image. We report all-in-focus FPM results of thyroid fine needle aspiration (FNA) cytology samples, demonstrating our method’s ability to overcome the height variance of 30 μm caused by cell aggregation, and rendering images at high resolution (corresponds to a standard microscope with objective NA of 0.75) and that are all-in-focus. This technology is applicable to standard microscopes, and we believe can have an impact on diagnostic accuracy as well as ease and speed of diagnosing challenging specimens. While we focus on cytology slides here, we anticipate this technology’s advantages will translate well for histology applications. This technique also addresses the issue of remote rapid evaluation of cytology preparations. Finally, we believe that by resolving the focus heterogeneity issues in standard digital images, this technique is a critical advance for applying machine learning to cytology specimens.

High-resolution optical imaging within thick objects has been a challenging task due to the short working distance of conventional high numerical aperture (NA) objective lenses. Lenses with a large physical diameter and thus a large aperture, such as microscope condenser lenses, can feature both a large NA and a long working distance. However, such lenses suffer from strong aberrations. To overcome this problem, we present a method to correct the aberrations of a transmission-mode imaging system that is composed of two condensers. The proposed method separately identifies and corrects aberrations of illumination and collection lenses of up to 1.2 NA by iteratively optimizing the total intensity of the synthetic aperture images in the forward and phase-conjugation processes. At a source wavelength of 785 nm, we demonstrated a spatial resolution of 372 nm at extremely long working distances of up to 1.6 mm, an order of magnitude improvement in comparison to conventional objective lenses. Our method of converting microscope condensers to high-quality objectives may facilitate increases in the imaging depths of super-resolution and expansion microscopes.

Mid-infrared optics require optical coatings composed of high- and low-refractive-index dielectric layers for the design of optical mirrors, filters, and anti-reflection coatings. However, there are not many technologies for depositing a material with a refractive index of less than 2 and a low loss in the mid-infrared region. Here, we present a unique deposition method of crosslinked polyethylene thin film for mid-IR optical filter design. Polyethylene has a refractive index of 1.52 in the mid-infrared region and a small number of absorption peaks, so it is useful for making optical filters in the mid-infrared region. Only 1 keV of energy is required to crosslink the entire film by irradiating an electron beam while depositing polyethylene. In addition, crosslinked polyethylene thin film has high mechanical strength, so there is no cracking or peeling when used with germanium. This allows for the use of crosslinked polyethylene as a low refractive index for mid-infrared optical coating.

Although field emission devices are inherently robust to high temperature and radiation environments as well as have high switching speeds, their development has been hindered by high voltages that are typically required for their operation. In this work, we investigate the effect of thin-film praseodymium (Pr) coating on the emission characteristics of a lateral gold (Au) field emitter array. Because Pr has a significantly lower work function than Au, it is expected to increase the field emission measured current. Pr is deposited onto the device via thermal angled evaporation in a custom-built vacuum chamber with in situ electrical characterization capability. Our experiments demonstrate that a 10 nm-thick Pr layer reduces the turn-on voltage by almost half compared to the noncoated Au structure. These results are promising for the development of power-efficient, low voltage field emission electronics.