Traceability is a key factor for the agri-food sector. Radio-frequency identification (RFID) technology, which is widely adopted for supply chain management, can be used effectively for the traceability management. In this paper, a framework for the evaluation of a traceability system for the agri-food industry is presented, and the automation level in an RFID-based traceability system is analyzed and compared with respect to traditional ones. Internal and external traceabilities are both considered and formalized, in order to classify different environments, according to their automation level. Traceability systems used in a sample sector are experimentally analyzed, showing that, by using RFID technology, agri-food enterprises increase their automation level and also their efficiency, in a sustainable way.
The paper describes a systematic approach for automatically introducing data and code redundancy into an existing program written using a high-level language. The transformations aim at making the program able to detect most of the soft-errors affecting data and code, independently of the Error Detection Mechanisms (EDMs) possibly implemented by the hardware. Since the transformations can be automatically applied as a pre-compilation phase, the programmer is freed from the cost and responsibility of introducing suitable EDMs in its code. Preliminary experimental results are reported, showing the fault coverage obtained by the method, as well as some figures concerning the slow-down and code size increase it causes.
1 December 2000 in IEEE Transactions on Nuclear Science
This paper deals with a software modification strategy allowing on-line detection of transient errors. Being based on a set of rules for introducing redundancy in the high-level code, the method can be completely automated, and is therefore particularly suited for low-cost safety-critical microprocessor-based applications. Experimental results are presented and discussed, demonstrating the effectiveness of the approach in terms of fault detection capabilities
1 August 1996 in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems