Prof. Jian Liu was born in Jilin, China, in 1966. He received a B.S. degree in semiconductor physics and devices from Jilin University, Changchun, China, in 1988, an M.Phil. degree in physics from The University of Birmingham, Birmingham, United Kingdom, in 1998, and a Dr. Rer. Nat. degree in physics from Julius Maximilian Universität Würzburg, Würzburg, Germany, in 2003. He is a full professor in microelectronics and solid state electronics with the State
Key Laboratory of Superlattices and Microstructures, Institute of
Semiconductors, Chinese Academy of Sciences, Beijing 100083, China, and Center
of Materials Science and Optoelectronics Engineering, University of Chinese
Academy of Sciences, Beijing 100049, China. His current research interests
include semiconductor optoelectronic detectors, THz imagers, and metamaterials.
Prof. Jian Liu was born in Jilin, China, in 1966. He received a B.S. degree in semiconductor physics and devices from Jilin University, Changchun, China, in 1988, an M.Phil. degree in physics from The University of Birmingham, Birmingham, United Kingdom, in 1998, and a Dr. Rer. Nat. degree in physics from Julius Maximilian Universität Würzburg, Würzburg, Germany, in 2003. He is a full professor in microelectronics and solid state electronics with the State
Key Laboratory of Superlattices and Microstructures, Institute of
Semiconductors, Chinese Academy of Sciences, Beijing 100083, China, and Center
of Materials Science and Optoelectronics Engineering, University of Chinese
Academy of Sciences, Beijing 100049, China. His current research interests
include semiconductor optoelectronic detectors, THz imagers, and metamaterials.