The influence of the medium on the properties of nanoparticles of Ag prepared by ablation of the second harmonic silver target of solid-state laser Nd: YAG laser (SOLAR LQ 215, λ_gen = 532 nm, E_imp =90 mJ, τ = 10 ns) was studied. As a medium the water, isopropyl alcohol, acetone, ethylene glycol, ethyl acetate and toluene were used. The concentration of Ag nanoparticles equaled to 3.5*10^-4 mol/l was determined by weight change before and after the target ablation during 10 minutes ablation. The results showed the average size of the nanoparticles has different values depending on the medium. The smallest size of the silver nanoparticles obtained in water (d = 0.75 nm), and the largest one in the acetone (d = 72.4 nm). The spherical shape of nanoparticles was found out in all solvents except the isopropyl alcohol in which the nanoparticles have the tetragonal form. The plasmon peaks of the nanoparticles in acetone, ethyl acetate, ethylene glycol are observed at wavelengths equal to 410, 408 and 420 nm, respectively. Time measuring of the optical densities of the solution showed that the stable nanoparticles of Ag are obtained in the next range of the solvents: acetone, water, isopropyl alcohol.

The influence of the annealing medium of thin films of nickel oxide (NiOx) on structural, optical and electrical transport properties is studied in this paper. NiOx films were synthesized by sol-gel method and annealed at a temperature of 300 °C in air, inert nitrogen (N2), oxygen (O2) gases and vacuum. The values of the films thickness were determined from the transverse cleavage of the SEM image. The films thickness depends on the annealing medium. Measurements of the EDX spectra of NiOx films were carried out. Analysis of the quantitative O/Ni ratio showed that the film annealed in an air atmosphere is close to the stoichiometric parameters of NiO. Measurements of the EDX spectra of NiOx films were carried out. According to the Raman spectra, an increase in peak intensities is observed indicating an increase in the density of defects in the film by Ni vacancies depending on the annealing medium. Absorption spectra and Tauc plots of NiOх films were obtained. The optical density of the films depends on the annealing conditions of the films. Data analysis shows that the band gap width depends on the annealing medium and varies from Eg = 3.12 eV to Eg = 3.45 eV. The analysis of the impedance spectra allowed us to estimate the values of the resistances R1 and R2. It is shown that an increase in the resistance of R1 is associated with a decrease in the density of defects in the NiOx film, decrease in the recombination resistance of R2, and an increase in recombination processes at the interface.