Umutcan Gürer

Umutcan Gürer

orcid

Research Focus & Metrics

Academic Career Length

7Years (2020-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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17 February 2025 in IEEE Transactions on Electron Devices
Verified
Journal Article
Closed access
EYERCAN YILMAZ
ERCAN YILMAZ
HWHaodong Wang
Haodong Wang
EDEmre Doganci
Emre Doganci
Meixin FengMeixin Feng
Meixin Feng
QSQian Sun
Qian Sun
EBErhan Budak
Erhan Budak
The p-GaN gate high electron mobility transistor (HEMT) with a 2.0 × 10-5 cm2 sensitive area as a UV photodetector (PD) has been designed and fabricated in this study. AlGaN/gallium nitride (GaN) heterostructure was adopted to get a 2-D electron gas (2DEG) as a conductive channel, resulting in a high photoresponsivity of 8.07 × 104 A/W, a sharp cutoff wavelength at 360 nm, high UV-to-visible rejection ratio of 1.80 × 106, rise and decay time of 0.12 and 1.0 ms, respectively. The dark current of 5.44 × 10-7 A, the photocurrent of 4.42 × 10-3 A at 5 V, the external quantum efficiency (EQE) of 2.77% × 105%, and the detectivity of 8.31 × 1014 Jones for the UV PD were determined under a low UV light intensity of 5 mW/cm2 at 360-nm UV illumination. The obtained results show that the performance of as-fabricated UV PD based on AlGaN/GaN HEMT is significantly improved compared to the literature. This device, which has lower noise equivalent power (NEP) and enhanced detectivity features compared to existing ones, is a promising candidate for military and space applications.

18 January 2025 in Sensors
Verified
Journal Article
Open access
PDF file
Miloš MarjanovićMiloš Marjanović
Miloš Marjanović
Stefan D. IlićStefan D. Ilić
Stefan D. Ilić
Sandra VeljkovicSandra Veljkovic
Sandra Veljkovic
NMNikola Mitrovic
Nikola Mitrovic
UGUmutcan Gürer
Umutcan Gürer
EYERCAN YILMAZ
ERCAN YILMAZ
We report on a procedure for extracting the SPICE model parameters of a RADFET sensor with a dielectric HfO2/SiO2 double-layer. RADFETs, traditionally fabricated as PMOS transistors with SiO2, are enhanced by incorporating high-k dielectric materials such as HfO2 to reduce oxide thickness in modern radiation sensors. The fabrication steps of the sensor are outlined, and model parameters, including the threshold voltage and transconductance, are extracted based on experimental data. Experimental setups for measuring electrical characteristics and irradiation are described, and a method for determining model parameters dependent on the accumulated dose is provided. A SPICE model card is proposed, including parameters for two dielectric thicknesses: (30/10) nm and (40/5) nm. The sensitivities of the sensors are 1.685 mV/Gy and 0.78 mV/Gy, respectively. The model is calibrated for doses up to 20 Gy, and good agreement between experimental and simulation results validates the proposed model.

1 June 2026
Verified
Conference Paper
Closed access
Miloš MarjanovićMiloš Marjanović
Miloš Marjanović
DDDanijel Dankovic
Danijel Dankovic
GRGoran Ristić
Goran Ristić
Sandra VeljkovicSandra Veljkovic
Sandra Veljkovic
NMNikola Mitrovic
Nikola Mitrovic
OYOzan Yılmaz
Ozan Yılmaz

1 January 2020 in Rap 2019 Conference Proceedings
Verified
Conference Paper
Open access
AKAysegul Kahraman
Aysegul Kahraman
BMBerk Morkoc
Berk Morkoc
AMALEX MUTALE
ALEX MUTALE
UGUmutcan Gürer
Umutcan Gürer
EYERCAN YILMAZ
ERCAN YILMAZ