The objective of this work was to establish the relationship between the calculated subsurface scattered-photon distribution and the mathematical quantity known as point-spread function (PSF). Photon distribution of subsurface scattered light was calculated using the Monte Carlo method developed for describing reflectance and opacity of paper and of images printed on paper. The obtained normalized photon distribution made it possible to separate optical and mechanical components of dot gain for the paper-ink system. In the presented method of obtaining the reflectance profile of a screen element, the PSF convolves with a modelled reflectance profile of that element. It was found that the PSF can be better approximated by means of the Lorentzian function when compared to the Gaussian profile that was used in the past research on this topic.

The importance of accurate identification of the edge spread function for the paper-ink system is closely related with the possibility of separating mechanical and optical dot gain. Our approach is based on the precise fit of the edge spread function, ESF. Namely, all of the research so far incorporates symmetric ESF, in contrast to the research reported so far, in which only the symmetric ESF has been considered¸ which is not realistic, due to the presence of dot gain. This approach, based on image analysis, allows us to identify uniquely the domain of impact of each contribution. Six different paper-ink systems are analyzed and discussed, and all of them show a satisfactory correlation with the proposed model.

Studying the importance of the color and shape perception with peripheral vision on the screen has an important role in digital design to provide designers with guidelines for better performance that will contribute to more functional...

Rapid development and expanding deployment of additive manufacturing mark this technology as an acceptable alternative to traditional methods of production in terms of speed and quality. All types of additive manufacturing technologies...