Tsuriel Avraham holds a B.Sc. degree in Electronic Engineering from Ben-Gurion University as well as an M.Sc. degree in Electronic Engineering from Ariel University. He is currently pursuing a Ph.D. at Ariel University in the Microelectronics Lab within the Department of Electrical Engineering, under the guidance of Prof. J.B. Bernstein. His research focuses on the reliability and failure analysis of GaN HEMT devices. Before starting his doctoral studies, he worked as a research assistant on several academic projects, where he developed a strong interest in finding new solutions in electronics and microfabrication.