Environmental management of solar photovoltaic (PV) modules is attracting attention as a growing number of field-operated PV modules approach end of life (EoL). PV modules may contain small amounts of toxic metals, and the procedures for assessing and regulating the toxic metal content and release of such materials at EoL differ widely across nations. This paper provides an overview of the metal composition of PV modules and common procedures for toxicity assessment through extensive research and review of technical literature and legislative documents. This review focuses on three primary aspects: first, it explores the distribution of toxic elements within current and emerging PV module designs, with a specific focus on obtaining representative samples for proportional toxicity testing within different module laminate areas. Second, it examines a sampling standard and the diverse toxicity testing methods and regulations employed in various regions, encompassing standards like the Environmental Protection Agency (EPA) Test Method 1311 (Toxicity Characteristic Leaching Procedure, TCLP) in the U.S., Restriction of Hazardous Substances (RoHS) in Europe, and the Waste Extraction Test (WET) in California. Third, the review examines the sources of variability in toxicity testing outcomes, including techniques for securing homogeneous samples from non-uniform PV modules, selecting particle sizes representative of landfill conditions in extracted samples, determining appropriate leachate characteristics such as leaching agents and pH levels, and considering factors like test duration and temperatures. In summary, this review summarizes relevant regulations and offers a comprehensive overview of the strengths and limitations associated with several toxicity assessment procedures currently in practice.

The ultraviolet fluorescence (UVF) imaging method has been widely used as a rapid and economic field inspection tool for investigating encapsulant discoloration of field-aged photovoltaic (PV) modules. In field-aged PV modules, encapsulant discoloration can result in a pronounced decrease in the short-circuit current. The spatial distribution of environmental stressors and therefore discoloration pattern over each cell of a module depends on the climate. In this article, we investigated the discoloration patterns (and their correlation with electrical parameters of modules and the extracted-cells from the modules) of ten modules produced at the same manufacturing facility and retrieved respectively from two distinct climates of Arizona (hot-dry; seven modules; 18 years of exposure) and Florida (hot-humid; three modules; ten years of exposure). In the Arizona modules, three distinct spatial patterns were observed in the UVF images: cell center region (intense browning); cell edge region (no browning); region between cell center; and cell edge region (light browning). However, in the Florida modules, only two distinct spatial distributions were observed: nonedge cell region (medium browning) and cell edge region (no browning). Furthermore, we employed a high-contrast UVF imaging technique to correlate the interdependence between the encapsulant discoloration pattern and the metallization/contact degradation pattern. For this correlative study, various experimental characterizations were carried out on both field-aged (Arizona and Florida) and unexposed modules and the cells extracted from the modules of the same model and they include: processed UVF and EL images, and I-V, TLM, optical microscopy, and XPS measurements.

A system of 180 monocrystalline aluminum back-surface field modules were installed in Cocoa, Florida, for 10 years. In total, 156 modules are characterized and compared to 3 controls. Power degradation rates vary between $-$ 0.14% to $-$ 3.22% per year, with median and average rates of −0.92% and −1.05% per year, respectively. The losses are primarily resistive with minor optical and recombination loss contributions. Electroluminescence imaging shows a characteristic pattern, which is shown to be resistive in nature when compared to photoluminescence. Resistive losses are due to corrosion of the rear contact Ag/solder interface and, to a much lesser degree, gridline Ag oxidation. Moisture ingress through the backsheet is likely responsible for mediating corrosion. Optical losses are due mostly to a combination of antireflection coating degradation, minor encapsulant browning, and delamination. Minor front contact corrosion may contribute to recombination. This study expands upon previous work on this vintage of the module by examining a large sample set, comprehensive characterization including techniques not previously used on these modules, and a comparison between two other systems of different climates.

The current popularity of photovoltaic (PV) systems is due in large part to their exceptional reliability and significantly lower cost than other energy sources. Studying cell and module degradation is key to promote further development in the state of the art. Fielded oraccelerated aged modules exhibit different failure modes, of which metallization degradation (contacts and interconnections) is prevalent. In this work, we discuss how multiscale characterization methods can be applied to a variety of module technologies that have been field exposed and have undergone accelerated age testing. These methods include performing characterization on the module level, cell level, and finally the materials level. The observed performance losses from the module- and cell-level characterization can be correlated with materials properties to find out the root cause of degradation. We recommend an initial nondestructive characterization suite, including module- and cell-level current–voltage ( $I\text{--}V$ ), Suns– V _OC , photoluminescence and electroluminescence imaging, quantum efficiency, ultraviolet fluorescence imaging, and thermal infrared imaging. Samples are then extracted from particularly degraded regions of the module and prepared for materials characterization techniques, such as top-down and cross-sectional scanning electron microscopy, energy-dispersive X-ray spectroscopy, X-ray photoelectron spectroscopy, secondary ion mass spectrometry, Raman spectroscopy, and transmission electron microscopy, allowing a deeper look into the mechanism behind the metallization degradation. This article serves as an instructional review to introduce the different multiscale characterization methods and how they can be effectively applied to perform PV degradation studies. We also share some of our examples and discuss the strengths, limitations, and best practices for each of the characterization techniques.