The switching function of traditional waveplates necessitates mechanical replacement or the superimposition of multiple waveplates, which gives rise to a complex system and a large volume. We have devised a multifunctional micro-waveplate based on the COMSOL simulation platform (v5.6), which concurrently integrates the compact nature of metasurfaces and the dynamic regulatory features of phase-change materials. When the phase-change material is in the crystalline phase, the metasurface possesses the functionality of a half-waveplate (HWP) and is capable of performing chirality inversion of circularly polarized light within the wavelength range of 1.45 μm to 1.52 μm and 1.56 μm to 1.61 μm. When the phase-change material is in the amorphous phase, the metasurface serves as a quarter-waveplate (QWP) and can achieve the conversion between linear and circular polarization through a 90° phase delay. The phase-change metasurface breaks through the constraint of fixed functions of traditional optical waveplates, facilitating the development of optical systems towards miniaturization, intelligence, and low power consumption and providing a crucial technical route for the next generation of photonic integration and dynamic optical applications.

Integrating metasurface-based polarizing filters atop photodetectors enables the expansion of detection capabilities from intensity to polarization, offering significant potential for applications requiring high-precision discrimination in scientific, industrial, and defense sectors. However, such metasurfaces often introduce optical efficiency losses. Here, we present a long-wave infrared (8.6 μm) circularly polarized photodetector capable of direct chiral discrimination, eliminating the need for additional optical components. The polarization selectivity arises from Guided-Mode resonances (GMRs) excited by two horizontally offset right-trapezoidal unit cells within a chiral metasurface. This design exhibits a pronounced transmittance contrast (~100%) between left circularly polarized light (LCP) and right circularly polarized light (RCP) while maintaining fabrication simplicity via a conventional single-step lithographic process. The proposed detector is expected to achieve high-dimensional physical characterization by resolving polarization-encoded vectorial information, demonstrating enhanced performance in complex environments.