Surface relief gratings and refractive index gratings are formed by direct holographic recording in amorphous chalcogenide nanomultilayer structures ${\mathrm{As}}_2{\mathrm{S}}_3-\mathrm{Se}$ and thin films ${\mathrm{As}}_2{\mathrm{S}}_3$. The evolution of the grating parameters, such as the modulation of refractive index and relief depth in dependence of the holographic exposure, is investigated. Off-axis digital holographic microscopy is applied for the measurement of the photoinduced phase gratings. For the high-accuracy reconstruction of the wavefront (amplitude and phase) transmitted by the fabricated gratings, we used a computational technique based on the sparse modeling of phase and amplitude. Both topography and refractive index maps of recorded gratings are revealed. Their separated contribution in diffraction efficiency is estimated.

In this paper, we have applied a recently developed complex-domain hyperspectral denoiser for the object recognition task, which is performed by the correlation analysis of investigated objects’ spectra with the fingerprint spectra from the same object. Extensive experiments carried out on noisy data from digital hyperspectral holography demonstrate a significant enhancement of the recognition accuracy of signals masked by noise, when the advanced noise suppression is applied.

This Letter discusses the generation of 3D-printed micro-optics to obtain the desired beam profile from a multimode vertical-cavity surface-emitting laser (VCSEL) with a significantly reduced divergence angle via the usage of high-resolution two-photon polymerization. Due to the low cost and compact packaging, the VCSEL array is a novel light source for structured-light projection. Particularly for long-distance 3D sensing applications, a greatly reduced divergence angle ensures that a good signal with a sufficiently large number of photons can be recorded, and the projected illumination spots do not overlap. Therefore, exact laser beam characterization and appropriate physical modeling are required in accurate production of an optimal collimator lens. Furthermore, elliptical beam profiles with different orientations can solve the correspondence problem and improve the post-processing speed and robustness in structured light. To generate this special type of beam profile and verify the optical design process, this Letter describes thoroughly the optical prototyping process starting from the beam characterization, the optical design to the production of the two-photon polymerized optics, and its validation. The test of the beam profile and divergence confirm a good match of the produced optics with the physical optical simulation in Zemax. The collimator transforms the input laser beam divergence angle of 324 mrad to an output angle of 20 mrad only.

This paper demonstrates the usefulness of spectrally resolved digital holography for dual-wavelength optical metrology. Based on the large degree of phase information available, multiple de-correlated dual-wavelength phase maps can be generated, which, when averaged, result in a signal-to-noise-ratio improvement. Compared with single-wavelength averaging, no further post-processing of the reconstructed dual-wavelength phase map is required. Moreover, the constraint imposed on the wavelength stability, as experienced in the conventional dual-wavelength method, can be relaxed, and the corresponding synthetic wavelength is adapted to the object under investigation. In addition, the possibility of optical sectioning based on the narrow-width coherence envelope is also demonstrated in transmission mode.

This paper addresses the effect and influence of wave optical aberrations and surface roughness on the chromatic confocal signal and resulting measurement errors. Two possible approaches exist for implementing chromatic confocal imaging based on either refraction or diffraction. Both concepts are compared and an expression for the expected chromatic longitudinal aberrations when using a diffractive optical element is derived. Since most chromatic confocal sensors are point sensors, the discussion on wave-optical aberrations is focused on spherical aberrations. Against common belief, the effect of spherical aberrations cannot be eliminated in the calibration process using for instance a piezo mounted mirror. It will be shown in the following that even a diffraction limited system with peak to valley spherical aberration smaller than 0.25 wavelength suffers from measurement errors. Experimental results will be shown to highlight this important issue. In order to develop a deeper understanding of the underlying physics, a wave-optical simulation environment has been realized. This wave-optical model furthermore enables the investigation of the influence of roughness. Herethereto the correct choice of numerical aperture when investigating a rough surface is based on a heuristic approach. Using the wave-optical simulations an explanation for the increased noise when employing a low numerical aperture to examine rough surfaces will be derived. Furthermore, a formula is presented to support the selection of the correct numerical aperture with regards to the roughness parameters of the surface under investigation.