In this study, porous silicon (PSi) was prepared and tested as an extended gate field-effect transistor (EGFET) for pH sensing. The prepared PSi has pore sizes in the range of 500 to 750 nm with a depth of approximately 42 µm. The results of testing PSi for hydrogen ion sensing in different pH buffer solutions reveal that the PSi has a sensitivity value of 66 mV/pH that is considered a super Nernstian value. The sensor considers stability to be in the pH range of 2 to 12. The hysteresis values of the prepared PSi sensor were approximately 8.2 and 10.5 mV in the low and high pH loop, respectively. The result of this study reveals a promising application of PSi in the field for detecting hydrogen ions in different solutions.

Purpose: This paper aims to investigate the characteristics of ultra-fine lead-free solder joints reinforced with TiO₂ nanoparticles in an electronic assembly. Design/methodology/approach: This study focused on the microstructure and quality of solder joints. Various percentages of TiO₂ nanoparticles were mixed with a lead-free Sn-3.5Ag-0.7Cu solder paste. This new form of nano-reinforced lead-free solder paste was used to assemble a miniature package consisting of an ultra-fine capacitor on a printed circuit board by means of a reflow soldering process. The microstructure and the fillet height were investigated using a focused ion beam, a high-resolution transmission electron microscope system equipped with an energy dispersive X-ray spectrometer (EDS), and a field emission scanning electron microscope coupled with an EDS and X-ray diffraction machine. Findings: The experimental results revealed that the intermetallic compound with the lowest thickness was produced by the nano-reinforced solder with a TiO₂ content of 0.05 Wt.%. Increasing the TiO₂ content to 0.15 Wt.% led to an improvement in the fillet height. The characteristics of the solder joint fulfilled the reliability requirements of the IPC standards. Practical implications: This study provides engineers with a profound understanding of the characteristics of ultra-fine nano-reinforced solder joint packages in the microelectronics industry. Originality/value: The findings are expected to provide proper guidelines and references with regard to the manufacture of miniaturized electronic packages. This study also explored the effects of TiO₂ on the microstructure and the fillet height of ultra-fine capacitors.

Purpose: This study aims to investigate the NiO nano-reinforced solder joint characteristics of ultra-fine electronic package. Design/methodology/approach: Lead-free Sn-Ag-Cu (SAC) solder paste was mixed with various percentages of NiO nanoparticles to prepare the new form of nano-reinforced solder paste. The solder paste was applied to assemble the ultra-fine capacitor using the reflow soldering process. A focussed ion beam, high resolution transmission electron microscopy system equipped with energy dispersive X-ray spectroscopy (EDS) was used in this study. In addition, X-ray inspection system, field emission scanning electron microscopy coupled with EDS, X-ray photoelectron spectroscopy (XPS) and nanoindenter were used to analyse the solder void, microstructure, hardness and fillet height of the solder joint. Findings: The experimental results revealed that the highest fillet height was obtained with the content of 0.01 Wt.% of nano-reinforced NiO, which fulfilled the reliability requirements of the international IPC standard. However, the presence of the NiO in the lead-free solder paste only slightly influenced the changes of the intermetallic layer with the increment of weighted percentage. Moreover, the simulation method was applied to observe the distribution of NiO nanoparticles in the solder joint. Originality/value: The findings are expected to provide a profound understanding of nano-reinforced solder joint’s characteristics of the ultra-fine package.

The purpose of this paper is to discuss the effect of blast wave on the microstructure, intermetallic layers and hardness properties of Sn0.3Ag0.7Cu (SAC0307) lead-free solder. Soldered samples were exposed to the blast wave by using trinitrotoluene (TNT) explosive. Microstructure and intermetallic layer thickness were identified using Alicona^® Infinite Focus Measurement software. Hardness properties of investigated solders were determined using a nanoindentation approach. It was found that microstructure and intermetallic layers changed under blast wave condition. Hardness properties of exposed solders decreased with increasing TNT explosive weight. Microstructural evolution and mechanical properties of the exposed solder to the blast wave provides fundamental understanding on how blast waves can affect the reliability of solder joint, especially for military applications.

An accelerated reliability testing via thermal cycling test (TCT) was used to test ball grid array (BGA) components’ reliability. Five variables were observed; control sample J and samples K, L, M, and N were BGA component samples that have been exposed to TCT between 500 and 1250 cycles with the TCT profile in the range of 0 °C–100 °C. The crack orientation of the individual solder joint was analyzed along with the propagation path pattern on the solder array of the BGA component pad by analyzing the dye and pull test results that were then mapped and analyzed using the cardinal and ordinal directions approach. This is to determine the crack propagation path direction in the solder array and track the potential of warpage on the BGA package as the TCT cycles progressed. A cross section was performed on sample M with the 3-D X-ray and scanning electron microscopy (SEM) analysis to observe the solder joints’ fracture lines and surface topographies. The results showed that individual solder joint crack orientation is correlated to the crack propagation location on the BGA package. The solder joint from northwest (NW), northeast (NE), southeast (SE), and southwest (SW) of the BGA package is prone to solder crack compared to the solder joint array in the middle. A solder grain structure coarsening occurred at the crack propagation due to the high cyclic strain from the TCT.