To realize application of functional material Photo-Thermo-Refractive (PTR) glass for integrated photonic device production, PTR glass material is fabricated and employed as matrix material for planar optical waveguide manufacturing. Buried optical waveguide, with a core dimension of $8.7\,\,\mu \text{m}\,\,\times 9.0\,\,\mu \text{m}$ (width by height), and its front edge located at approximately $12.5~\mu \text{m}$ underneath the glass substrate surface, is obtained by using thermal ion exchange (TIE) and subsequent field-assisted ion migration (FAIM). Transmission loss of these waveguides can be reduced to a value as low as 0.08 dB/cm at the operating wavelength of 1550 nm, and the coupling loss to standard single-mode-fiber is measured to be 0.47 dB/facet, demonstrating the feasibility of low-loss integrated photonic devices fabrication on PTR glass materials by ion exchange technology.

Parallel phase-shifting digital holography (PPSDH) employing a polarization image sensor can suppress zero-order and twin-image noise through a single exposure, achieve instantaneous measurement of complex-valued dynamic objects, and have broad applications in the areas of biomedicine, etc. To improve the imaging resolution of PPSDH, we propose an oversampled super-pixel image reconstruction method, which can be expressed as the implementation of nearest-neighbor interpolation to replace blank pixels in sparse sub-phase-shift holograms. We found experimentally that the maximum spatial lateral resolution of the reconstructed image based on the existing super-pixel method, B-spline, bicubic, bilinear, and the proposed nearest-neighbor interpolation was 12.4 µm, 11.4 µm, 9.8 µm, 8.8 µm, and 7.8 µm, respectively. The main reason for not reaching the ideal value of 6.9 µm was the inherent residual zero-order and twin-image noise, which needs to be removed in the future.

Complex optical elements have the advantages of improving image quality and optical performance and expanding the field of view. Therefore, it is widely used in X-ray scientific devices, adaptive optical elements, high-energy laser systems, and other fields and is a hot research direction in precision optics. Especially for precision machining, there is a greater need for high-precision testing technology. However, how to measure complex surfaces efficiently and accurately is still an important research topic in optical metrology technology. In order to verify the ability of optical metrology for complex optical surfaces with wavefront sensing based on image information of the focal plane, some experiment platforms in different types of optical surfaces were set up. In order to validate the feasibility and validity of wavefront-sensing technology based on image information of focal planes, a large number of repetitive experiments were carried out. The measurement results with wavefront sensing based on image information of the focal plane were compared with the measurement results with the ZYGO interferometer. The experimental results demonstrate that good agreement is obtained among the error distribution, PV value, and RMS value of the ZYGO interferometer, which shows the feasibility and validity of wavefront sensing based on image information of focal plane technology in optical metrology for the complex optical surface.

In this paper, we demonstrate the use of the modified phase retrieval as a method for application in the measurement of small-slope free-form optical surfaces. This technique is a solution for the measurement of small-slope free-form optical surfaces, based on the modified phase retrieval algorithm, whose essence is that only two defocused images are needed to estimate the wave front with an accuracy similar to that of the traditional phase retrieval but with less image capturing and computation time. An experimental arrangement used to measure the small-slope free-form optical surfaces using the modified phase retrieval is described. The results of these experiments demonstrate that the modified phase retrieval method can achieve measurements comparable to those of the standard interferometer.

To improve their spatial resolution and detection capabilities, future ground-based optical telescopes will have a size of 30 m, and the aperture of space telescopes will be increased to 10 m. Such large optical systems necessitate the development of large integrated testing equipment. In this study, spectrum and system alignment measurements and wavefront quality checking were performed using the sub-aperture detection method and a fiber-connected Photonics Scanning Pentaprism (PSP). First, the system was aligned using an optical truss, ensuring that the optical axis was properly positioned. Second, using a sub-aperture light beam though the entrance pupil, light spots were formed on the focal plane and transmitted to the spectrometer via fibers to obtain the corresponding spectral components. Then, by taking measurements at different system positions, a full-aperture spectrum response could be reached. Lastly, by photon-integrated interference on the focal plane, intensity interference fringes could be projected at the entrance pupil of the system. And the wavefront quality of the system could be verified by observing the fringe deformation. The measurement accuracy of the optical axis of the system is better than 2 mrad. The spectral measurement accuracy was better than 5%, and the wavefront measurement accuracy surpassed 0.1 wavelengths (1 wavelength = 633 nm). This study effectively enhanced the detection and in situ calibration capabilities of large telescope systems, ensuring that the performance requirements can be met in the design of future telescopes.

In order to verify the estimated wave-front ability of the phase retrieval, a method utilized in the measurement of the aspherical optical surfaces using the phase retrieval technology is described. This technique is based on the algorithm as a solution for the measurement of the aspherical optical surfaces, whose principle is sampling a number of the given defocus images and obtaining the phase information by solving the wave-front with Fourier optical diffractive theory and mathematics optimization. We set up an experimental arrangement used to measure the aspherical optical surfaces using the improved phase retrieval. In addition, we introduced the method of optical alignment in detail, which is very important for high-precision measurements. We obtained an agreement among the error distributions, the peak value, and the root-mean-square value of a ZYGO interferometer, which demonstrates that the improved phase retrieval method can effectively estimate the wave-front and the aberrations of aspherical optical surfaces.