E-symmetry optical phonons at the Γ point of LiNbO3 and LiTaO3 were experimentally resolved in spectra measured by infrared and Raman spectroscopy. For this purpose, congruent and nearly stoichiometric crystals of LiNbO3 and LiTaO3, and mixed LiNb1−xTaxO3, crystals were studied. The results show that some of the E modes have weak intensities in Raman or infrared spectra. Thus the complete assignment of E-symmetry modes has been achieved by comparing Raman and infrared data. In addition, this assignment has been confirmed by Raman measurements at low temperatures.
30 April 2013 in Journal of Physics: Condensed Matter
Phase composition of epitaxial/textured LiNbO3 films on sapphire substrates, grown by pulsed laser deposition, atmospheric pressure metal organic chemical vapor deposition and pulsed injection metal organic chemical vapor deposition was studied by conventional x-ray diffraction techniques. Raman spectroscopy, being highly sensitive to the symmetry of materials, was used as a countercheck in the compositional analysis. The wavenumbers of Raman modes of LiNb3O8 and Li3NbO4 phases were identified from Raman spectra of synthesized powders. Asymmetry of profiles of x-ray diffraction reflections of LiNbO3 films was studied. This asymmetry may have different origins which consequently may result in misleading conclusions about phase composition of textured LiNbO3 films.
This study was dedicated to the investigation of poly(vinylidene fluoride) (PVDF) micropillar arrays obtained by soft lithography followed by phase inversion at a low temperature. Reduced graphene oxide (rGO) was incorporated into the PVDF as a nucleating filler. The piezoelectric properties of the PVDF-rGO composite micropillars were explored via piezo-response force microscopy (PFM). Fourier transform infrared spectroscopy (FTIR) and X-ray diffraction (XRD) showed that α, β, and γ phases co-existed in all studied samples, with a predominance of the γ phase. The piezoresponse force microscopy (PFM) data provided the local piezoelectric response of the PVDF micropillars, which exhibited a temperature-induced downward dipole orientation in the pristine PVDF micropillars. The addition of rGO into the PVDF matrix resulted in a change in the preferred polarization direction, and the piezo-response phase angle changed from −120° to 20°–40°. The pristine PVDF and PVDF loaded with 0.1 wt % of rGO after low-temperature quenching were found to possess a piezoelectric response of 86 and 87 pm/V respectively, which are significantly higher than the |d33eff| in the case of imprinted PVDF 64 pm/V. Thus, the addition of rGO significantly affected the domain orientation (polarization) while quenching increased the piezoelectric response.
New Zr, Hf and Y 2,7,7-trimethyl-3,5-octanedionates (tod) as well as the corresponding Cu β-diketonate have been synthesized and characterized by FT-IR, elemental analyses, TGA, and 1H NMR or ESR. The molecular structure of Hf(tod)4 has been determined by single-crystal X-ray diffraction, the metal displays a square antiprismatic geometry. Zr, Hf and Y β-diketonates were investigated as precursors for MOCVD deposition of ZrO2, HfO2 and yttria-stabilized hafnia thin films. The films were characterized by XRD, XPS, EDS and AFM. Highly textured and in-plane oriented films were deposited on sapphire by pulsed liquid injection MOCVD. Zr(tod)4 and Hf(tod)4 precursors lead to higher growth rates of ZrO2 and HfO2 films at lower temperatures than conventional Zr(thd)4 and Hf(thd)4 precursors (thd = 2,2,6,6-tetramethyl-3,5-heptanedionate) and are attractive new precursors for oxide films.