Surface defect inspection plays an important role in the process of industrial manufacture and production. Though Convolutional Neural Network (CNN) based defect inspection methods have made huge leaps, they still confront a lot of challenges such as defect scale variation, complex background, low contrast, and so on. To address these issues, we propose a joint attention-guided feature fusion network (JAFFNet) for saliency detection of surface defects based on the encoder-decoder network. JAFFNet mainly incorporates a joint attention-guided feature fusion (JAFF) module into decoding stages to adaptively fuse low-level and high-level features. The JAFF module learns to emphasize defect features and suppress background noise during feature fusion, which is beneficial for detecting low-contrast defects. In addition, JAFFNet introduces a dense receptive field (DRF) module following the encoder to capture features with rich context information, which helps detect defects of different scales. The JAFF module mainly utilizes a learned joint channel-spatial attention map provided by high-level semantic features to guide feature fusion. The attention map makes the model pay more attention to defect features. The DRF module utilizes a sequence of multi-receptive-field (MRF) units with each taking as inputs all the preceding MRF feature maps and the original input. The obtained DRF features capture rich context information with a large range of receptive fields. Extensive experiments conducted on SD-saliency-900, Magnetic tile, and DAGM 2007 indicate that our method achieves promising performance in comparison with other state-of-the-art methods. Meanwhile, our method reaches a real-time defect detection speed of 66 FPS.

Surface defect detection is an important step in ensuring product quality in various manufacturing industries. Existing methods have achieved significant results, but there are still challenges, such as the lack of real-time detection speed, low contrast between defects and background, and insufficient handling of defect details. To address these issues, we introduce a lightweight and efficient method called Context-Aware Adaptive Weighted Attention Network (CAWANet) for real-time surface defect segmentation. To handle the computational resource constraints when dealing with deep features, we introduce Context-Aware Adaptive Weighted Convolution (CAWAConv), which aims to extract deep features while suppressing noise interference. This allows the model to remain lightweight without compromising its ability to recognize subtle defect characteristics. Additionally, during the feature fusion stage, we propose the Feature Detail Improvement (FDI) module to capture more complex defect details. The FDI module enhances the representation of defect-related information, further optimizing the segmentation results. We conducted experimental evaluations of CAWANet on three surface defect detection datasets: the magnetic tile, NEU-Seg, and MSD. The experimental results indicate that our proposed CAWANet strikes a favorable balance between accuracy and inference speed compared to other state-of-the-art methods. Our code will be available at https://github.com/ZGWzzu/CAWANet.

Segment anything model (SAM) has recently demonstrated powerful segmentation ability for natural scene images (NSIs). However, the SAM exhibits limited performance in defect detection owing to the weak appearance of defects and cluttered backgrounds in industrial images. In this article, we propose a hierarchically adapting SAM for pixel-wise surface defect detection, named DefectSAM, which effectively modulates and decodes multilevel features of the encoder to capture defect information. Specifically, we introduce a learnable feature adaptation component between the image encoder and the decoder to modulate each level of features via the dual-feature adaptation unit. The dual-feature adaptation unit mainly includes the correlation-gated feature adaptation (CGFA) module and the mask-guided feature adaptation (MGFA) module. The CGFA exploits cross correlation spatial gating maps to adaptively incorporate a convolutional feature pyramid and Transformer features during feature adaptation, which is beneficial for capturing defect details. Moreover, the MGFA utilizes the mask prediction of high-level features as semantic guidance to select top-confidence foreground and background tokens for feature adaptation, focusing more on defect details and suppressing background noise. Extensive experiments on three defect detection datasets (i.e., MVTec AD, CrackSeg9k, ZJU-Leaper, and Magnetic tile) demonstrate that the proposed method achieves state-of-the-art performance with few learnable parameters, which greatly improves the generalization of SAM in defect detection.

Deep learning based defect inspection methods have achieved promising performance, which usually relies on a large number of well-labeled training samples. However, it requires much effort to obtain enough annotated samples especially pixel-level annotations in practical production. Generative adversarial networks (GANs) can be utilized to generate defect samples. However, training GANs typically requires a large amount of defect data and most of them cannot generate defect samples with pixel-level annotations. In this paper, we present a Mask-Guided Defect image generation method, called MGDefect, which can generate high-quality defect samples with pixel-level annotations and effectively improves the performance of downstream tasks. Specifically, MGDefect consists of a Mask-Guided Defect Generation GAN (MGDG-GAN) and a Defect Mask GAN (DM-GAN). MGDG-GAN generates images containing defects with specific locations, shapes, and sizes via mask guidance and the dual discrimination for defects at the region level and image level. DM-GAN aims to generate diverse and rational masks for MGDG-GAN. It also adopts region-level and image-level dual discrimination for masks to generate compatible masks with the target objects. MGDG-GAN mainly focuses on generating local defect regions and DM-GAN specializes in generating masks, which are both trained on limited defect samples and abundant normal samples. Experiments conducted on the MVTec AD, DAGM 2007, and KolektorSDD2 benchmark datasets demonstrate that our method achieves promising results compared with other state-of-the-art approaches. Meanwhile, the generated defect samples significantly improve the performance of defect inspection tasks including classification and segmentation. Specifically, our method achieves KID$\times 10^{3}$/IS scores of 48.35/2.27 on MVTec AD, 15.37/2.44 on DAGM 2007, and 19.70/2.01 on KolektorSDD2. Furthermore, our method improves mIoU by 10.59%, 2.20%, and 2.17% on these datasets, respectively, using U-Net as the segmentation model.