Mei yuk Tam

Ms. Mei yuk Tam

orcid

Research Focus & Metrics

Academic Career Length

7Years (2020-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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29 May 2025 in Measurement Science and Technology
Verified
Journal Article
Open access
MTMei yuk Tam
Mei yuk Tam
HWHenry Wong
Henry Wong
YHYixiao Han
Yixiao Han
GJGang Jin
Gang Jin
YCYuk Ting Hester Chow
Yuk Ting Hester Chow
The paper introduces an innovative approach called Zernike-based CMM Surface Metrology (ZCSM) to enhance the accuracy of measuring large optical surfaces using coordinate measuring machines (CMMs). Traditional methods like laser interferometry and deflectometry, while precise, face limitations such as restricted dynamic range and sensitivity to specific surface properties. CMMs offer a promising alternative but are susceptible to systematic errors, particularly due to probe deflection when scanning, which can introduce geometric errors not present on the test surface. ZCSM addresses this challenge by fitting the surface form using Zernike polynomials, decomposing form errors into wavefront aberrations. A notable feature of the ZCSM method is the dual-parameter error compensation, which iteratively removes errors by correcting wavefront aberrations and verifying surface profiles until within the tolerance range. The feasibility of ZCSM was validated by measuring an astronomical mirror using a ZEISS XENOS CMM. The results showed that ZCSM’s accuracy is comparable to interferometry, underscoring its potential as a viable alternative for precision metrology. The research indicates that ZCSM significantly improves the measurement accuracy of CMMs for large optical surfaces. Future research could focus on refining the method to eliminate higher-order residual aberrations and angular offsets, further enhancing its precision and applicability.

10 November 2020 in Computer-Aided Design and Applications
Verified
Journal Article
Closed access
MTMei yuk Tam
Mei yuk Tam
KYKai Yu
Kai Yu
Computer-Aided Design and Applications is an international journal on the applications of CAD and CAM. It publishes papers in the general domain of CAD plus in emerging fields like bio-CAD, nano-CAD, soft-CAD, garment-CAD, PLM, PDM, CAD data mining, CAD and the internet, CAD education, genetic algorithms and CAD engines. The journal is aimed at all developers and users of CAD technology to ptovide CAD solutions for various stages of design and manufacturing. The journal publishes all about Computer-Aided Design and Computer-Aided technologies.

7 August 2026 in Metrology
Verified
Journal Article
Open access
PDF file
MTMei yuk Tam
Mei yuk Tam
HWHenry Wong
Henry Wong
YHYixiao Han
Yixiao Han
GJGang Jin
Gang Jin
YCYuk Ting Hester Chow
Yuk Ting Hester Chow
Precise measurement of large mirrors is essential for high-performance space-based optics. Traditionally, laser interferometry provides high accuracy but faces challenges related to the requirements of computer-generated holograms (CGHs) and the transformation of standard wavefronts to match complex test surfaces. This paper presents a proof-of-concept contact-based surface metrology method for large mirrors. To reduce drift errors caused by stylus instability or contact loss, a wavefront-based calibration method was developed to suppress measurement artifacts while preserving intrinsic surface errors. The method was tested on a concave aspherical mirror using a tactile coordinate measuring machine (CMM), and its accuracy was evaluated by comparing deviations between calibrated CMM error maps and laser-based measurements. Experimental results demonstrated that the XENO CMM achieved a global metric accuracy comparable to interferometric systems for relevant geometric parameters. These findings suggest that ultra-precision CMMs combined with focus point calibration can provide practical preliminary surface verification and serve as a flexible alternative to laser interferometry when global geometric accuracy is the primary concern. Future work will enhance robustness by addressing higher-order aberrations.