Since 2016, the two free-electron laser (FEL) lines FLASH1 and FLASH2 have been run simultaneously for users at DESY in Hamburg. With the installation of variable gap undulators in the new FLASH2 FEL line, many new possibilities have opened up in terms of photon parameters for experiments. What has been tested so far is post-saturation tapering, reverse tapering, harmonic lasing, harmonic lasing self-seeding and two-color lasing. At the moment, we are working on concepts to enhance the capabilities of the FLASH facility even further. A major part of the upgrade plans, known as FLASH2020, will involve the exchange of the fixed gap undulators in FLASH1 and the implementation of a new flexible undulator scheme aimed at providing coherent radiation for multi-color experiments over a broad wavelength range. The recent achievements in FLASH2 and the current status of plans for the further development of the facility are presented.

Characterizing the properties of X-ray free-electron laser (XFEL) sources is a critical step for optimization of performance and experiment planning. The recent availability of MHz XFELs has opened up a range of new opportunities for novel experiments but also highlighted the need for systematic measurements of the source properties. Here, MHz-enabled beam imaging diagnostics developed for the SPB/SFX instrument at the European XFEL are exploited to measure the shot-to-shot intensity statistics of X-ray pulses. The ability to record pulse-integrated two-dimensional transverse intensity measurements at multiple planes along an XFEL beamline at MHz rates yields an improved understanding of the shot-to-shot photon beam intensity variations. These variations can play a critical role, for example, in determining the outcome of single-particle imaging experiments and other experiments that are sensitive to the transverse profile of the incident beam. It is observed that shot-to-shot variations in the statistical properties of a recorded ensemble of radiant intensity distributions are sensitive to changes in electron beam current density. These changes typically occur during pulse-distribution to the instrument and are currently not accounted for by the existing suite of imaging diagnostics. Modulations of the electron beam orbit in the accelerator are observed to induce a time-dependence in the statistics of individual pulses – this is demonstrated by applying radio-frequency trajectory tilts to electron bunch-trains delivered to the instrument. We discuss how these modifications of the beam trajectory might be used to modify the statistical properties of the source and potential future applications.

Many coherent imaging applications that utilize ultrafast X-ray free-electron laser (XFEL) radiation pulses are highly sensitive to fluctuations in the shot-to-shot statistical properties of the source. Understanding and modelling these fluctuations are key to successful experiment planning and necessary to maximize the potential of XFEL facilities. Current models of XFEL radiation and their shot-to-shot statistics are based on theoretical descriptions of the source and are limited in their ability to capture the shot-to-shot intensity fluctuations observed experimentally. The lack of accurate temporal statistics in simulations that utilize these models is a significant barrier to optimizing and interpreting data from XFEL coherent diffraction experiments. Presented here is a phenomenological model of XFEL radiation that is capable of capturing the shot-to-shot statistics observed experimentally using a simple time-dependent approximation of the pulse wavefront. The model is applied to reproduce non-stationary shot-to-shot intensity fluctuations observed at the European XFEL, whilst accurately representing the single-shot properties predicted by FEL theory. Compared with previous models, this approach provides a simple, robust and computationally inexpensive method of generating statistical representations of XFEL radiation.

Electro-optical bunch arrival time measurement is a method to monitor the timing of bunches in predominantly linear electron accelerators to below femtosecond precision. Despite the method being well established, a stable and fully available measurement was reported only recently. DESY’s free-electron lasers FLASH and EuXFEL feature Bunch Arrival Time (BAM) diagnostics that serve as a standard operation data source for the facility’s longitudinal fast and slow stabilization, as well as an instrument available to the users for pump laser alignment and offline analysis. A comprehensive upgrade and R&D effort targeting the performance of DESY’s BAM was carried out in recent years. The complexity of the device poses challenges to its control layer, calibration, drift control, and operation setup. Solving these proved to be essential in reaching operational stability and high availability. We report on the updates to the BAM controls and the development of automation of numerous tasks that contributed a great deal to achieving long-term stability and full run availability.