Dr. Claudia Cancellieri is a group leader/ research scientist at Empa in the Laboratory for Joining technologies and corrosion. In 2008 she obtained her PhD in Physics at Ecole Polytechnique Federal in Lausanne (EPFL), specializing in Pulsed Laser Deposition growth of cuprates and oxide thin films under strain. During her first post-Doc at the University of Geneva, she focused on the growth and characterization of complex oxide interfaces. She continued the investigation of this topic at the synchrotron Swiss Light Source, Paul Scherrer Institute where she extensively used spectroscopy techniques to derive the electronic band structure of buried complex oxide interfaces. Her current research topics include the investigation of microstructure, defects, stress and electronic properties of functional materials including multilayers systems.
Research Keywords & Expertise
Stress Analysis
XRD x-ray diffraction
Photoemission spectros...
Thin film and coating
Multilayer and nanocom...
Fingerprints
19%
Thin film and coating
8%
Photoemission spectroscopies
5%
Stress Analysis
5%
Multilayer and nanocomposite inorganic thin films
Short Biography
Dr. Claudia Cancellieri is a group leader/ research scientist at Empa in the Laboratory for Joining technologies and corrosion. In 2008 she obtained her PhD in Physics at Ecole Polytechnique Federal in Lausanne (EPFL), specializing in Pulsed Laser Deposition growth of cuprates and oxide thin films under strain. During her first post-Doc at the University of Geneva, she focused on the growth and characterization of complex oxide interfaces. She continued the investigation of this topic at the synchrotron Swiss Light Source, Paul Scherrer Institute where she extensively used spectroscopy techniques to derive the electronic band structure of buried complex oxide interfaces. Her current research topics include the investigation of microstructure, defects, stress and electronic properties of functional materials including multilayers systems.
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