Sungkyun Park received his B.S. (1994) and M.Sc. (1995) in Physics from Pusan National University, Korea, and his Ph.D. (2001) in Physics from the University of Arizona (Tucson, AZ, USA) under the supervision of C. M. Falco, and was working on surface characterization studies in various nanomaterials, with particular emphasis on structural, chemical, and magnetic state variations. After his Ph.D., Sungkyun completed his postdoctoral work at Los Alamos National Laboratory and as a scientific associate in Argonne National Lab for neutron scattering science. In 2008, he was appointed as an Assistant Professor in Pusan National University, Busan, South Korea. He became Associate Professor in 2012, followed by becoming a full-time Professor in 2017. His research interests include 1) phase transition characteristics of various nanomaterials (e.g., thin films), 2) interface magnetism, 3) spectroscopic analysis of various nanocomposites for the microscopic origin of physical property variation using X-ray photoelectron spectroscopy.
Sungkyun Park received his B.S. (1994) and M.Sc. (1995) in Physics from Pusan National University, Korea, and his Ph.D. (2001) in Physics from the University of Arizona (Tucson, AZ, USA) under the supervision of C. M. Falco, and was working on surface characterization studies in various nanomaterials, with particular emphasis on structural, chemical, and magnetic state variations. After his Ph.D., Sungkyun completed his postdoctoral work at Los Alamos National Laboratory and as a scientific associate in Argonne National Lab for neutron scattering science. In 2008, he was appointed as an Assistant Professor in Pusan National University, Busan, South Korea. He became Associate Professor in 2012, followed by becoming a full-time Professor in 2017. His research interests include 1) phase transition characteristics of various nanomaterials (e.g., thin films), 2) interface magnetism, 3) spectroscopic analysis of various nanocomposites for the microscopic origin of physical property variation using X-ray photoelectron spectroscopy.