Patrick Fiorenza received his M.Sc. in Physics and PhD in Material Science from the University of Catania in 2003 and 2007, respectively. In 2005, he was a visiting scientist at IMEC (Belgium). Since 2011, he has been a researcher at CNR-IMM. His research activity is mainly focused on carrier transport, trapping phenomena and reliability at metal/insulator/semiconductor and metal/semiconductor interfaces in SiC and GaN. He has recognized experience in the characterization of advanced materials and devices via scanning probe microscopy. He is the co-author of more than 180 papers and three book chapters.