Juan Jiménez

Prof. Juan Jiménez

orcid

Research Focus & Metrics

Academic Career Length

34Years (1993-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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2 December 1999 in Thin Solid Films
Verified
Journal Article
Closed access
JOJ Olivares
J Olivares
PMP Martı́n
P Martı́n
ARA Rodrı́guez
A Rodrı́guez
JSJ Sangrador
J Sangrador
JJJuan Jiménez
Juan Jiménez
TRT Rodrı́guez
T Rodrı́guez

13 July 2020 in Energy Science & Engineering
Verified
Journal Article
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MGMiguel Guada
Miguel Guada
ÁMÁngel Moretón
Ángel Moretón
SRSofía Rodríguez‐Conde
Sofía Rodríguez‐Conde
LSLuis Alberto Sánchez
Luis Alberto Sánchez
MMMario Martínez
Mario Martínez
OMOscar Martínez
Oscar Martínez
Among the many characterization techniques for solar panel testing, two, electroluminescence (EL) and photoluminescence (PL), can provide useful visual information about the presence of different types of cell defects. EL is performed outdoors by night in commercial solar plants due to the very weak luminescence emission compared to sunlight. PL faces the added difficulty of needing to find a large‐area homogeneous light source to excite the modules. Since nighttime work poses many drawbacks and risks, a daylight outdoor EL/PL system would be useful for offering safe inspection of solar plants. We present daylight luminescence techniques based on a bias switching method, in which a pulsed luminescence signal is obtained by alternating the polarization state of the solar panels, synchronizing it with the luminescence image detection by an InGaAs camera. Fast switching and selecting an optimized exposure time are key to achieving high‐quality images. The daylight luminescence method described herein allows both EL and PL luminescence images to be obtained, even under high solar irradiance conditions.

1 January 2021 in Journal of the European Ceramic Society
Verified
Journal Article
Closed access
LFLaura Fernández-Rodríguez
Laura Fernández-Rodríguez
DLD. Levy
D. Levy
MZM. Zayat
M. Zayat
JJJuan Jiménez
Juan Jiménez
GMG.C. Mather
G.C. Mather
MPM.J. Pascual
M.J. Pascual

24 June 2019 in Journal of Physics D: Applied Physics
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Jorge SoutoJorge Souto
Jorge Souto
Jose Luis PuraJose Luis Pura
Jose Luis Pura
JJJuan Jiménez
Juan Jiménez
Catastrophic optical damage (COD) of high power laser diodes is a crucial factor limiting ultra high power lasers. The understanding of the COD process is essential to improve the endurance of the high power laser diodes. COD is observed as a process in which the active part of the laser diode is destroyed, forming characteristic defects, the so called dark line defects (DLDs). The DLDs are formed by arrays of dislocations generated during the laser operation. Local heating associated with non-radiative recombination is assumed to be at the origin of the COD process. A summary of the methods used to assess the COD, both in real time and post-mortem is presented. The main approaches developed in recent years to model the heat transport in the laser structures under non homogeneous temperature distribution are overviewed. Special emphasis is paid to the impact of the low dimensionality of QWs in two physical properties playing a major role in the COD process, namely, thermal conductivity and mechanical strength. A discussion about the impact of the nanoscale in both physical properties is presented. Finally, we summarize the main issues of the thermomechanical modelling of COD. Within this model the COD is launched when the local thermal stresses generated around the heat source overcome the yield stress of the active zone of the laser. The thermal runaway is related to the sharp decrease of the thermal conductivity once the onset of plasticity has been reached in the active zone of the laser.

4 January 2023 in Materials Today Chemistry
Verified
Journal Article
Closed access
FAF. Ayachi
F. Ayachi
KSK. Saidi
K. Saidi
MDM. Dammak
M. Dammak
WCW. Chaabani
W. Chaabani
IMI. Mediavilla-Martínez
I. Mediavilla-Martínez
JJJuan Jiménez
Juan Jiménez

27 October 2008 in Applied Physics Letters
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Journal Article
Closed access
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AMA. Martín-Martín
A. Martín-Martín
MAM. Avella
M. Avella
MIM. P. Iñiguez
M. P. Iñiguez
JJJuan Jiménez
Juan Jiménez
MOM. Oudart
M. Oudart
JNJ. Nagle
J. Nagle
The degradation of AlGaAs based high power laser bars (808 nm) is modeled in terms of the thermal stress gradient induced by the overheating produced at a facet defect by self-absorption and nonradiative recombination. Using a thermomechanical model, the local heating at the defect is shown to induce local stress above the yield strength necessary for plastic deformation. Cathodoluminescence images of the facets show the formation of large facet defects. The role of the packaging stress is also elucidated. The power density dissipation and the local temperature necessary to achieve the plastic deformation are in good agreement with the experimental values reported for laser degradation.