Considering typical spectra of a broad range of carbonaceous materials from gas-shale to nanotubes, various ways by which defects show up in Raman spectra are exampled and discussed. The position, resonance behavior, and linewidth of both the D and G bands are compared, even if in some cases obtaining accurate information on the materials from the fitting parameters is a difficult task. As a matter of fact, even if a full picture is unreachable, defining parameter trends is one acceptable option. Two ways to determine the linewidth, either graphically and or by fitting are proposed in order to be able to compare literature data. The relationship between the crystallite size obtained from the linewidth and from X-ray diffraction, which is complementary to the Tuinstra and Koenig law, is examined. We show that a single approach is not possible unless modeling is performed and therefore that analysis of Raman spectra should be adapted to the specificities of each sample series, i.e., a minimum of knowledge about the materials is always required.

We measure by dynamic atomic force microscopy the dissipated energy when a contact line moves on an individual nanotopographical defect.