Guijun Bi

Dr. Guijun Bi

Singapore Institute of Manufacturing Technology (SIMTech), Singapore
orcid

Research Focus & Metrics

Academic Career Length

21Years (2006-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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1 November 2021 in International Journal of Machine Tools and Manufacture
Verified
Journal Article
Closed access
Chaolin TanChaolin Tan
Chaolin Tan
FWFei Weng
Fei Weng
SSShang Sui
Shang Sui
YCYouxiang Chew
Youxiang Chew
Guijun BiGuijun Bi
Guijun Bi

1 December 2017 in Scripta Materialia
Verified
Journal Article
Closed access
Biao ChenBiao Chen
Biao Chen
SMSeung Ki Moon
Seung Ki Moon
XYX. Yao
X. Yao
Guijun BiGuijun Bi
Guijun Bi
JSJianghua Shen
Jianghua Shen
KKK. Kondoh
K. Kondoh

1 April 2014 in Materials & Design (1980-2015)
Verified
Journal Article
Closed access
JGJ.F. Guo
J.F. Guo
HCH.C. Chen
H.C. Chen
CSC.N. Sun
C.N. Sun
Guijun BiGuijun Bi
Guijun Bi
ZSZ. Sun
Z. Sun
JWJ. Wei
J. Wei

19 May 2009 in Applied Physics A
Verified
Journal Article
Closed access
PDF file
GNG. K. L. Ng
G. K. L. Ng
Jarfors AndersJarfors Anders
Jarfors Anders
Guijun BiGuijun Bi
Guijun Bi
HZH. Y. Zheng
H. Y. Zheng

22 April 2024 in Journal of Manufacturing Systems
Verified
Journal Article
Closed access
LCLequn Chen
Lequn Chen
Guijun BiGuijun Bi
Guijun Bi
XYXiling Yao
Xiling Yao
JSJinlong Su
Jinlong Su
CTChaolin Tan
Chaolin Tan
SMSeung Ki Moon
Seung Ki Moon

15 October 2020 in Virtual and Physical Prototyping
Verified
Journal Article
Closed access
LCLequn Chen
Lequn Chen
XYXiling Yao
Xiling Yao
PXPeng Xu
Peng Xu
SMSeung Ki Moon
Seung Ki Moon
Guijun BiGuijun Bi
Guijun Bi
Surface monitoring is an essential part of quality assurance for additive manufacturing (AM). Surface defects need to be identified early in the AM process to avoid further deterioration of the part quality. In this paper, a rapid surface defect identification method for directed energy deposition (DED) is proposed. The main contribution of this work is the development of an in-situ point cloud processing with machine learning methods that enable automatic surface monitoring without sensor intermittence. An in-house software platform with a multi-nodal architecture is developed. In-situ point cloud processing steps, including filtering, segmentation, surface-to-point distance calculation, point clustering, and machine learning feature extraction, are performed by multiple subprocesses running simultaneously. The combined unsupervised and supervised machine learning techniques are applied to detect and classify surface defects. The proposed method is experimentally validated, and a surface defect identification accuracy of 93.15% is achieved.