The current status of research around the world concurs on the powerful influence of micro- and nano-textured surfaces in terms of surface functionalization. In order to characterize the manufactured topographical morphology with regard to the surface quality or homogeneity, major efforts are still required. In this work, an optical approach for the indirect evaluation of the quality and morphology of surface structures manufactured with Direct Laser Interference Patterning (DLIP) is presented. For testing the designed optical configuration, line-like surface patterns are fabricated at a 1064 nm wavelength on stainless steel with a repetitive distance of 4.9 µm, utilizing a two-beam DLIP configuration. Depending on the pulse to pulse overlap and hatch distance, different single and complex pattern geometries are produced, presenting non-homogenous and homogenous surface patterns. The developed optical system permitted the successfully classification of different pattern geometries, in particular, those showing single-scale morphology (high homogeneity). Additionally, the fabricated structures were measured using confocal microscopy method, and the obtained topographies were correlated with the recorded optical images.

In this study, a scatterometry-based monitoring system designed for tracking the quality and reproducibility of laser-textured surfaces in industrial environments was validated in off-line and real-time modes. To this end, a stainless steel plate was structured by direct laser interference patterning (DLIP) following a set of conditions with artificial patterning errors. Namely, fluctuations of the DLIP process parameters such as laser fluence, spatial period, and focus position are introduced, and also, two patterning strategies are implemented, whereby pulses are deliberately not fired at both deterministic and random positions. The detection limits of the system were determined by recording the intensities of the zero, first, and second diffraction order using a charge-coupled device (CCD) camera. As supported by topographical measurements, the system can accurately calculate spatial periods with a resolution of at least 100 nm. In addition, focus shifts of 70 µm from the optimum focus position can be detected, and missing patterned lines with a minimum width of 28 µm can be identified. The validation of this compact characterization unit represents a step forward for its implementation as an in-line monitoring tool for industrial laser-based micropatterning.

Structural colors can be induced on metals not only to fabricate logos or decorative motives but also to embed anti-counterfeit features for product protection. In this study, stainless steel (EN 1.4301) plates are colorized by growing a thin oxide layer using direct laser writing (DLW) and hidden anti-counterfeit measures are included on their surfaces by direct laser interference patterning (DLIP) processing. The periodic microstructures resulting from the DLIP treatment have a spatial period of 1 um and act as relief diffraction gratings, featuring a characteristic diffraction pattern. These microstructures are not visible to the human eye but are easily detectable upon shining a coherent beam on the surface. Furthermore, the reflectance over the visible spectrum of the colorized surfaces with and without the DLIP microtexture is measured, giving low differences in the color perception following the so-called "CIE L*a*b*" color space. Finally, a demonstrator is fabricated, in which colorized fields with and without the security features are shown.