Laurent Houssiau

Prof. Laurent Houssiau

Laboratoire Interdisciplinaire de Spectroscopie Electronique (LISE), Namur Institute of Structured Matter (NISM), University of Namur, rue de Bruxelles 61, 5000, Namur, Belgium

Research Focus & Metrics

Academic Career Length

23Years (2004-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

View All Publications
15 February 2021 in ACS Nano
Verified
Journal Article
Closed access
APAnna Pazniak
Anna Pazniak
MBMohamed Benchakar
Mohamed Benchakar
TBThomas Bilyk
Thomas Bilyk
ALAndrea Liedl
Andrea Liedl
YBYan Busby
Yan Busby
MDMarie-Laure David
Marie-Laure David

12 June 2020 in ACS Applied Polymer Materials
Verified
Journal Article
Closed access
PHP. Hirchenhahn
P. Hirchenhahn
ASA. Al Sayyad
A. Al Sayyad
JBJ. Bardon
J. Bardon
AFA. Felten
A. Felten
PPP. Plapper
P. Plapper
LHLaurent Houssiau
Laurent Houssiau

2 March 2019 in Materials
Verified
Journal Article
Open access
PDF file
CNCéline Noël
Céline Noël
SPSara Pescetelli
Sara Pescetelli
Antonio AgrestiAntonio Agresti
Antonio Agresti
AFAlexis Franquet
Alexis Franquet
VSValentina Spampinato
Valentina Spampinato
YBYan Busby
Yan Busby
Ion beam depth profiling is increasingly used to investigate layers and interfaces in complex multilayered devices, including solar cells. This approach is particularly challenging on hybrid perovskite layers and perovskite solar cells because of the presence of organic/inorganic interfaces requiring the fine optimization of the sputtering beam conditions. The ion beam sputtering must ensure a viable sputtering rate on hard inorganic materials while limiting the chemical (fragmentation), compositional (preferential sputtering) or topographical (roughening and intermixing) modifications on soft organic layers. In this work, model (Csx(MA0.17FA0.83)100−xPb(I0.83Br0.17)3/cTiO2/Glass) samples and full mesoscopic perovskite solar cells are profiled using low-energy (500 and 1000 eV) monatomic beams (Ar+ and Cs+) and variable-size argon clusters (Arn+, 75 < n < 4000) with energy up to 20 keV. The ion beam conditions are optimized by systematically comparing the sputtering rates and the surface modifications associated with each sputtering beam. X-ray photoelectron spectroscopy, time-of-flight secondary ion mass spectrometry, and in-situ scanning probe microscopy are combined to characterize the interfaces and evidence sputtering-related artifacts. Within monatomic beams, 500 eV Cs+ results in the most intense and stable ToF-SIMS molecular profiles, almost material-independent sputtering rates and sharp interfaces. Large argon clusters (n > 500) with insufficient energy (E < 10 keV) result in the preferential sputtering of organic molecules and are highly ineffective to sputter small metal clusters (Pb and Au), which tend to artificially accumulate during the depth profile. This is not the case for the optimized cluster ions having a few hundred argon atoms (300 < n < 500) and an energy-per-atom value of at least 20 eV. In these conditions, we obtain (i) the low fragmentation of organic molecules, (ii) convenient erosion rates on soft and hard layers (but still different), and (iii) constant molecular profiles in the perovskite layer, i.e., no accumulation of damages.

1 January 2019 in Organic Electronics
Verified
Journal Article
Closed access
GCGiulia Casula
Giulia Casula
YBYan Busby
Yan Busby
AFAlexis Franquet
Alexis Franquet
VSValentina Spampinato
Valentina Spampinato
LHLaurent Houssiau
Laurent Houssiau
Piero CossedduPiero Cosseddu
Piero Cosseddu

16 February 2016 in Journal of the American Society for Mass Spectrometry
Verified
Journal Article
Closed access
CNCéline Noël
Céline Noël
LHLaurent Houssiau
Laurent Houssiau

6 May 2019 in Journal of the American Society for Mass Spectrometry
Verified
Journal Article
Closed access
PDF file
CNCéline Noël
Céline Noël
YBYan Busby
Yan Busby
NMNicolas Mine
Nicolas Mine
LHLaurent Houssiau
Laurent Houssiau