Hanbing Chen

Dr. Hanbing Chen


Research Focus & Metrics

Academic Career Length

7Years (2020-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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3 February 2020 in Materials
Verified
Journal Article
Open access
PDF file
HCHanbing Chen
Hanbing Chen
ZQZhenbo Qin
Zhenbo Qin
MHMeifeng He
Meifeng He
YLYichun Liu
Yichun Liu
Zhong WuZhong Wu
Zhong Wu
Electrochemical atomic force microscopy (EC-AFM), a branch of a scanning probe microscopy (SPM), can image substrate topography with high resolution. Since its inception, it was extended to a wide range of research areas through continuous improvement. The presence of an electrolytic cell and a potentiostat makes it possible to observe the topographical changes of the sample surface in real time. EC-AFM is used in in situ corrosion research because the samples are not required to be electrically conductive. It is widely used in passive film properties, surface dissolution, early-stage corrosion initiation, inhibitor efficiency, and many other branches of corrosion science. This review provides the research progress of EC-AFM and summarizes the extensive applications and investigations using EC-AFM in corrosion science.