Red color conversion materials have often been used in conventional white LEDs (light-emitting diodes) to enhance the insufficient deep-red component and thus improve the color-rendering property. Quantum dots (QDs) are one of the candidates for this due to their flexibility in controlling the emission wavelength, which is attributed to the quantum confinement effect. Two types of remote QD components, i.e., QD films and QD caps, were prepared and applied to conventional white LED illumination to improve the color-rendering properties. Thanks to the red component near 630 nm caused by the QD components, the color rendering indices (CRIs) of both Ra and R9 could be increased to over 95. It was found that both the diffusing nature of the reflector and the light recycling process in the vertical cavity between the bottom reflector and the top optical films play important roles in improving the color conversion efficiency of remote QD components. The present study showed that the proper application of remote QDs combined with a suitable optical cavity can control the correlated color temperature of the illumination over a wide range, thus realizing different color appearances of white LED illumination. In addition, a high CRI of over 95 could be achieved due to the sufficient excitation from fewer QDs, due to the strong optical cavity effect.

Stretchable semiconductors capable of maintaining electrical performance under large mechanical deformation are essential for reliable wearable electronic devices. However, polymer semiconductors often suffer from electrical degradation when subjected to tensile strain. In this study, electrical stability under strain was achieved by using a rubber-blended poly(2,5-bis(2-octyldodecyl)-3,6-di(thiophen-2-yl)diketopyrrolo[3,4-c]pyrrole-1,4-dione-alt-thieno[3,2-b]thiophene) (DPPT-TT) polymer semiconductor based on a conjugated polymer/elastomer phase separation-induced elasticity (CONPHINE) structure. Unlike most previous studies on fully stretchable thin-film transistors (TFTs), which primarily report overall performance changes under mechanical strain, this work systematically identifies the dominant origin of electrical performance degradation through a stepwise electrical analysis encompassing the gate insulating layer, the semiconductor layer, and complete devices. Bottom-gate top-contact (BGTC) and bottom-gate bottom-contact (BGBC) devices were fabricated on rigid Si/SiO₂ substrates to examine the intrinsic properties of the DPPT-TT/styrene-ethylene-butylene-styrene (SEBS) CONPHINE film. As a result, the device exhibits 90% mobility retention even at 100% tensile strain applied parallel to the charge transport direction. Quantitative resistance analysis using the Y-function method reveals that variations in channel resistance play a dominant role in strain-induced performance degradation, whereas changes in contact resistance contribute only marginally. These findings demonstrate that stabilizing channel resistance, rather than contact resistance, is important for achieving high mobility retention under large mechanical deformation, thereby providing concrete and quantitative design guidelines for reliable stretchable TFTs.