The formation of cracks is often observed in the epitaxial growth of ultrawide-bandgap aluminum nitride (AlN) semiconductor films on economical and versatile silicon (Si) substrates due to the significant differences in in-plane lattice parameters and thermal expansion coefficients between the film and the substrate, which hampers the development of template, buffer layer, and device structure with a relatively thick AlN layer for devices. The present study aims to elucidate the conditions of crack formation through a simple but comprehensive estimation of strain energy accumulation and relaxation by lattice strain, misfit dislocation density, and crack formation. Strain energy in the epitaxial film from lattice and thermal mismatches is evaluated by an elastic strain equation tailored to the epitaxy of the hexagonal crystal structure. The effects of temperature, thickness, and dislocation density on the lattice and dislocation strain energies of the film are also considered. Finally, the comparison in the changes in the total strain energy and cleavage energy with decreasing temperature shows that cleavage energy is higher than strain energy if the film is thinner than 400 nm but becomes lower than the strain energy if the film is thicker than 400 nm during cooldown, suggesting the crack formation, which matches well with experimental observations.

Group-IIIb-transition-metal-alloyed wurtzite Group-IIIa-nitride (IIIb-IIIa-N) thin films have higher piezoelectric characteristics than binary IIIa-N for a broad range of applications in photonic, electronic, sensing, and energy harvesting systems. We perform theoretical thermodynamic analysis for the deposition and epitaxial growth of Y-alloyed GaN and AlN films by a newly introduced growth technique of hybrid chemical vapor deposition (HybCVD), which can overcome the limitations of the conventional techniques. We investigate the equilibrium vapor pressures in the source zones to determine the dominant precursors of cations for the input of the mixing zone. Then, we study the driving force for the vapor-solid phase reactions of cation precursors in the growth zone to calculate the relationship between the solid composition of Y_xGa_1−xN and Y_xAl_1−xN and the relative amount of input precursors (Y vs. GaCl and AlCl₃) in different deposition conditions, such as temperature, V/III precursor input ratio, and H₂/inert-gas mixture ratio in the carrier gas. The x_Y composition in YAlN changes nearly linearly with the input ratio of cation precursors regardless of the growth conditions. However, YGaN composition changes non-linearly and is also substantially affected by the conditions. The thermodynamic analysis provides insight into the chemistry involved in the epitaxial growth of IIIa-IIIb-N by the HybCVD, as well as the information for suitable growth conditions, which will guide the way for ongoing experimental efforts on the improvement of piezoelectricity of the lead-free piezoelectric materials.

Growing crack-free, epitaxial ultrawide-bandgap semiconductor films on cost-effective, large-area substrates, such as AlN on Si, poses a significant challenge due to substantial lattice and thermal expansion mismatches. We introduce an approach to mitigate tensile strain or reverse strain signs between the substrate and the AlN layer, thereby suppressing crack formation during the heteroepitaxial growth of thick III-N films. This approach introduces ductile metallic interlayers, specifically Au, to change the strain state of AlN from in-plane tensile to compressive, without initiating cracks. Furthermore, the Au interlayer is grown epitaxially as a single crystal, which prevents the transfer of tensile strain into the AlN film, as confirmed by x-ray diffraction and transmission electron microscopy. We demonstrate crack-free AlN films exceeding 1 μm in thickness. These findings hold significant promise for advancing the field of ultrawide-bandgap semiconductor materials, with potential applications in electronic, optoelectronic, sensing, and energy device applications.

Owing to the upsurge in the number of endangered species and understanding animal patterns in general as well as population demographics; the monitoring of wildlife species is an essential for the conservation and safety of animals. In order to organize and manage the reserves, the nature bequeaths to us, we need to have hands-on information of their population and food trends, conditions where they survive and other species in the ecosystem. The paper presents a vision-based approach to monitor wildlife using an aerial platform. A quad-rotor based aerial platform is used for the very first time for this purpose. Field imaging is done using a digital cellphone camera mounted on the platform to acquire video of horses in the field. Two techniques, Lucas-Kanade and Horn-Schunck methods are applied on the acquired set of images and the results are compared. Noise due to fluctuations and light conditions are minimized using Gaussian and HSV filters. Experiments show results with an absolute mean difference of 2.84 pixels and 8.50 pixels for changes in X and Y directions respectively for the two approaches.