Jian Huang

Jian Huang

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Jian Huang

College of Intelligent Robotics and Advanced Manufacturing, Fudan University, Shanghai, China

Research Focus & Metrics

Academic Career Length

15Years (2012-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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10 September 2024 in Knowledge-Based Systems
Verified
Journal Article
Closed access
ZRZeqi Ren
Zeqi Ren
JYJianbo Yu
Jianbo Yu
JHJian Huang
Jian Huang
XYXiaofeng Yang
Xiaofeng Yang
SLSiyang Leng
Siyang Leng
SYShifu Yan
Shifu Yan

22 September 2025 in IEEE Transactions on Cybernetics
Verified
Journal Article
Closed access
JYJianbo Yu
Jianbo Yu
JHJian Huang
Jian Huang
Weimin ZhongWeimin Zhong
Weimin Zhong
QJQing-Chao Jiang
Qing-Chao Jiang
XYXuefeng Yan
Xuefeng Yan
XYXiaofeng Yang
Xiaofeng Yang
Nonstationarity in industrial processes, guided by factors, such as equipment aging and changing upstream load demands, inherently exhibits heterogeneous characteristics. This complex overlay of homogeneous stationarity poses great difficulty in process monitoring and analysis. Therefore, this study presents a new model (Hs- ${\mathrm {H}}_{\mathrm {n}}$ ) that peels the homogeneous and heterogeneous nonstationarity, which has four components: a differentiated learning network (DL-Net), a peeling network (Pe-Net), an adaptive reweighting network (AR-Net), and a global decoder network. DL-Net obtains the differentiated representation by leveraging a new differentiated learning approach to unique inputs, which is based on the cognitive understanding and derivation of functional specialization and content learning during network training. The aim is to maximize functional diversity and minimize content overlap. Furthermore, Pe-Net extracts the stationarity and nonstationarity (S-N) components from each differentiated scale, formulated as an encoder–decoder–encoder architecture with an integrated identity subtraction skip connection. A min–max S-N constraint regulates the peeling process and controls the extracted content. AR-Net additionally refines homogeneous stationarity across each scale and reweights the individual components to adaptively adjust their contributions. Last, reweighted components are fused and input into the global decoder to facilitate unsupervised learning. Experimental results on three processes demonstrate the effectiveness of Hs-Hn.

18 March 2025 in IEEE Transactions on Instrumentation and Measurement
Verified
Journal Article
Closed access
JYJianbo Yu
Jianbo Yu
JHJian Huang
Jian Huang
XFXuewei Fu
Xuewei Fu
YJYu Jin
Yu Jin
XYXuefeng Yan
Xuefeng Yan
XYXiaofeng Yang
Xiaofeng Yang
Fault detection is crucial for ensuring the reliability and safety of industrial processes, as it helps prevent equipment failures and minimizes downtime. It has wide applications in industrial processes and machine intelligence but remains unsolved problems. Major challenges include the variations in data distribution and temporal dynamics due to the nonstationary nature, which is driven by factors such as frequent switching between operational modes, aging of distributed control sensors, and environmental variability. Traditional fault detectors are suboptimal, while nonstationary-aided methods easily make biased detections towards the multiple complex nonstationary components. In this paper, we present a new fault detection model for nonstationary processes through multiscale content learning to disentangle feature representations (MCD). MCD consists of three sub-modules: Diverse Content Module (DCM), Stationary and Nonstationary Disentanglement Module (SNDM), and Component Reweighting and Reconstruction Module (CR2M). DCM enriches multiple representations via multiscale modeling of network informational content. SNDM disentangles the homogeneous stationary and heterogeneous nonstationary (S-N) features from multiple local representations, which is formulated as an encoding-decoding-encoding process with a skip disentanglement and min-max constraint. CR2M further fuses local S-N features with an adaptive learnable reweighting strategy, achieving a fine-grained reallocation of the importance of global S-N attributes. Experimental results on a numerical process and a real-world process demonstrate the superiority of MCD in fault detection for nonstationary processes.

5 December 2025 in ISA Transactions
Verified
Journal Article
Closed access
JHJian Huang
Jian Huang
HRHang Ruan
Hang Ruan
JYJianbo Yu
Jianbo Yu
QJQing-Chao Jiang
Qing-Chao Jiang
XYXiaofeng Yang
Xiaofeng Yang

4 March 2026 in IEEE Transactions on Reliability
Verified
Journal Article
Closed access
HRHang Ruan
Hang Ruan
JHJian Huang
Jian Huang
ZLZhiyuan Li
Zhiyuan Li
JYJianbo Yu
Jianbo Yu
XYXuefeng Yan
Xuefeng Yan
XYXiaofeng Yang
Xiaofeng Yang
Due to the scarcity of fault samples in real-world industrial scenarios, few-shot fault diagnosis (FSFD) has attracted increasing attention, as it is vital for ensuring industrial safety and engineering reliability. However, existing metrics-based meta-learning approaches generally calculate fault similarity relying on global pairwise, which insufficiently exploit fault information and thus limit discrimination among fault types. To address the insensitivity to buried fault information in complete processes, we propose a novel framework called the local–global consistency relation network (LGCRN). The framework captures more comprehensive fault feature information through two components: the global branch, which focuses on macroinformation involving all join process units, and the local branch, which emphasizes finer granularity from specific units. In addition, a local–global alignment loss is utilized to optimize LGCRN, where self-cross relation improves the discriminability and stability of fault features by maintaining consistency between local and global branches. The self-cross relation comprises self-sample relation, ensuring consistency within the same sample at different granularities, and cross-sample relation, maintaining consistency across samples within the same class. Experiments on two benchmarks and a real semiconductor process demonstrate the feasibility and superiority of the proposed method, confirming its effectiveness in addressing limited-sample industrial fault diagnosis tasks and enabling timely maintenance crucial for operational safety in real-world scenarios.

7 September 2012 in Journal of Workplace Learning
Verified
Journal Article
Closed access
JHJian Huang
Jian Huang
HOHenning Salling Olesen
Henning Salling Olesen