Mostafa Ersali Salehi

Mostafa Ersali Salehi

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Mostafa Ersali Salehi

School of Electrical and Computer Engineering, University of Tehran, Tehran, Iran

Research Focus & Metrics

Academic Career Length

21Years (2006-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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8 May 2015 in IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Verified
Journal Article
Closed access
MNM. Hassan Najafi
M. Hassan Najafi
MSMostafa E. Salehi
Mostafa E. Salehi
Binarization plays an important role in document image processing, particularly in degraded document images. Among all local image thresholding algorithms, Sauvola has excellent binarization performance for degraded document images. However, this algorithm is computationally intensive and sensitive to the noises from the internal computational circuits. In this paper, we present a stochastic implementation of Sauvola algorithm. Our experimental results show that the stochastic implementation of Sauvola needs much less time and area and can tolerate more faults, while consuming less power in comparison with its conventional implementation.

9 August 2010 in IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Verified
Journal Article
Closed access
MSMostafa E. Salehi
Mostafa E. Salehi
MSMehrzad Samadi
Mehrzad Samadi
MNMehrdad Najibi
Mehrdad Najibi
AAAli Afzali-Kusha
Ali Afzali-Kusha
MPMasoud Pedram
Masoud Pedram
SFSied Mehdi Fakhraie
Sied Mehdi Fakhraie
An adaptive method to perform dynamic voltage and frequency scheduling (DVFS) for minimizing the energy consumption of microprocessor chips is presented. Instead of using a fixed update interval, the proposed DVFS system makes use of adaptive update intervals for optimal frequency and voltage scheduling. The optimization enables the system to rapidly track the workload changes so as to meet soft real-time deadlines. The technique, which can be realized with very simple hardware, is completely transparent to the application. The results of applying the method to some real application workloads demonstrate considerable power savings and fewer frequency updates compared to DVFS systems based on fixed update intervals.

1 February 2011 in Microelectronics Reliability
Verified
Journal Article
Closed access
FFFarshad Firouzi
Farshad Firouzi
MSMostafa E. Salehi
Mostafa E. Salehi
FWFan Wang
Fan Wang
SFSied Mehdi Fakhraie
Sied Mehdi Fakhraie

31 March 2021 in IEEE Design & Test
Verified
Journal Article
Closed access
SMSeyed Ahmad Mirsalari
Seyed Ahmad Mirsalari
NNNajmeh Nazari
Najmeh Nazari
SSSima Sinaei
Sima Sinaei
MSMostafa E. Salehi
Mostafa E. Salehi
Masoud DaneshtalabMasoud Daneshtalab
Masoud Daneshtalab
This article proposes a Fast and Compact Ternary LSTM (FaCTLSTM), which bridges the accuracy gap between the full-precision and quantized neural networks.

12 November 2019 in IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Verified
Journal Article
Closed access
IMIraj Moghaddasi
Iraj Moghaddasi
MNMostafa Ersali Salehi Nasab
Mostafa Ersali Salehi Nasab
MKMehdi Kargahi
Mehdi Kargahi

1 April 2010
Verified
Conference Paper
Closed access
AAAli Azarpeyvand
Ali Azarpeyvand
MSMostafa E. Salehi
Mostafa E. Salehi
FFFarshad Firouzi
Farshad Firouzi
AYAmir Yazdanbakhsh
Amir Yazdanbakhsh
SFSied Mehdi Fakhraie
Sied Mehdi Fakhraie
Advances in silicon technology and shrinking the feature size to nanometer scale make unreliability of nano devices the most important concern of fault-tolerant designs. Soft error analysis has been greatly aided by the concept of architectural vulnerability factor (AVF) and architecturally correct execution (ACE). In this work, we exploit the techniques of AVF analysis to introduce the instruction-level vulnerability metric for software reliability analysis. The proposed metric can be used to make judgments about the reliability of different programs on different processors with regard to architectural and compiler guidelines for improving the processor reliability.