Axel Persson

Dr. Axel Persson

Thin film physics, IFM, Linköping University
orcid

Research Focus & Metrics

Academic Career Length

11Years (2016-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

View All Publications
15 June 2017 in Nano Letters
Verified
Journal Article
Closed access
EMElvedin Memisevic
Elvedin Memisevic
MHMarkus Hellenbrand
Markus Hellenbrand
ELErik Lind
Erik Lind
APAxel Persson
Axel Persson
SSSaurabh Sant
Saurabh Sant
LWLars-Erik Wernersson
Lars-Erik Wernersson

8 October 2019 in Nature Communications
Verified
Journal Article
Open access
PDF file
CMCarina B. Maliakkal
Carina B. Maliakkal
DMDaniel Madsen
Daniel Madsen
MTMarcus Tornberg
Marcus Tornberg
APAxel Persson
Axel Persson
Jonas JohanssonJonas Johansson
Jonas Johansson
KDKimberly A. Dick
Kimberly A. Dick
Semiconductor nanowires offer the opportunity to incorporate novel structures and functionality into electronic and optoelectronic devices. A clear understanding of the nanowire growth mechanism is essential for well-controlled growth of structures with desired properties, but the understanding is currently limited by a lack of empirical measurements of important parameters during growth, such as catalyst particle composition. However, this is difficult to accurately determine by investigating post-growth. We report direct in situ measurement of the catalyst composition during nanowire growth for the first time. We study Au-seeded GaAs nanowires inside an electron microscope as they grow and measure the catalyst composition using X-ray energy dispersive spectroscopy. The Ga content in the catalyst during growth increases with both temperature and Ga precursor flux.

1 May 2022 in AIP Advances
Verified
Journal Article
Open access
PDF file
Daniela GogovaDaniela Gogova
Daniela Gogova
MGMisagh Ghezellou
Misagh Ghezellou
DTDat Q. Tran
Dat Q. Tran
SRSteffen Richter
Steffen Richter
APAlexis Papamichail
Alexis Papamichail
VDVanya Darakchieva
Vanya Darakchieva
The hot-wall metalorganic chemical vapor deposition (MOCVD) concept, previously shown to enable superior material quality and high performance devices based on wide bandgap semiconductors, such as Ga(Al)N and SiC, has been applied to the epitaxial growth of β-Ga2O3. Epitaxial β-Ga2O3 layers at high growth rates (above 1 μm/h), at low reagent flows, and at reduced growth temperatures (740 °C) are demonstrated. A high crystalline quality epitaxial material on a c-plane sapphire substrate is attained as corroborated by a combination of x-ray diffraction, high-resolution scanning transmission electron microscopy, and spectroscopic ellipsometry measurements. The hot-wall MOCVD process is transferred to homoepitaxy, and single-crystalline homoepitaxial β-Ga2O3 layers are demonstrated with a 2̄ 01 rocking curve width of 118 arc sec, which is comparable to those of the edge-defined film-fed grown (2̄ 01) β-Ga2O3 substrates, indicative of similar dislocation densities for epilayers and substrates. Hence, hot-wall MOCVD is proposed as a prospective growth method to be further explored for the fabrication of β-Ga2O3.

12 February 2020 in ACS Nano
Verified
Journal Article
Open access
CMCarina B. Maliakkal
Carina B. Maliakkal
EMErik K. Mårtensson
Erik K. Mårtensson
MTMarcus Ulf Tornberg
Marcus Ulf Tornberg
DJDaniel Jacobsson
Daniel Jacobsson
APAxel Persson
Axel Persson
KDKimberly A. Dick
Kimberly A. Dick
Control of the crystallization process is central to developing futuristic nanomaterials with atomic precision to meet the demands of electronic and quantum technology applications. Semiconductor nanowires grown by the vapor-liquid-solid process are a promising material system in which the ability to form components with structure and composition not achievable in bulk is well-established. Here we use in situ TEM imaging of Au-catalyzed GaAs nanowire growth to understand the processes by which the growth dynamics are connected to the experimental parameters. We find that two sequential steps in the crystallization process – nucleation and layer growth – can occur on similar time scales and can be controlled independently using different growth parameters. Importantly, the layer growth process contributes significantly to the growth time for all conditions, and will play a major role in determining material properties such as compositional uniformity, dopant density and impurity incorporation. The results are understood through theoretical simulations correlating the growth dynamics, liquid droplet and experimental parameters. The key insights discussed here are not restricted to Au-catalyzed GaAs nanowire growth by MOCVD but can be extended to most compound nanowire growths in which the different growth species has very different solubility in the catalyst particle.

1 September 2016 in Nano Letters
Verified
Journal Article
Open access
WMWondwosen Metaferia
Wondwosen Metaferia
APAxel Persson
Axel Persson
KMKilian Mergenthaler
Kilian Mergenthaler
FYFangfang Yang
Fangfang Yang
WZWei Zhang
Wei Zhang
MMMartin H. Magnusson
Martin H. Magnusson
We have grown GaAsP nanowires with high optical and structural quality by Aerotaxy, a new continuous gas phase mass production process to grow III–V semiconductor based nanowires. By varying the PH3/AsH3 ratio and growth temperature, size selected GaAs1–xPx nanowires (80 nm diameter) with pure zinc-blende structure and with direct band gap energies ranging from 1.42 to 1.90 eV (at 300 K), (i.e., 0 ≤ x ≤ 0.43) were grown, which is the energy range needed for creating tandem III–V solar cells on silicon. The phosphorus content in the NWs is shown to be controlled by both growth temperature and input gas phase ratio. The distribution of P in the wires is uniform over the length of the wires and among the wires. This proves the feasibility of growing GaAsP nanowires by Aerotaxy and results indicate that it is a generic process that can be applied to the growth of other III–V semiconductor based ternary nanowires.

14 September 2017 in Nano Letters
Verified
Journal Article
Closed access
OKOlli-Pekka Kilpi
Olli-Pekka Kilpi
JSJohannes Svensson
Johannes Svensson
JWJun Wu
Jun Wu
APAxel Persson
Axel Persson
RWReine Wallenberg
Reine Wallenberg
LWLars-Erik Wernersson
Lars-Erik Wernersson