Braulio Jose Alvarez

Dr. Braulio Jose Alvarez

Universidad de Oviedo, Oviedo, Asturias, Spain
orcid
Associate professor, Lecturer

Research Focus & Metrics

Academic Career Length

23Years (2004-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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2 August 2013 in The International Journal of Advanced Manufacturing Technology
Verified
Journal Article
Closed access
PDF file
ANA. Noriega
A. Noriega
David BlancoDavid Blanco
David Blanco
Braulio Jose AlvarezBraulio Jose Alvarez
Braulio Jose Alvarez
AGA. García
A. García

2 June 2009 in The International Journal of Advanced Manufacturing Technology
Verified
Journal Article
Closed access
PDF file
SMSusana Martínez-Pellitero
Susana Martínez-Pellitero
EDUARDO CUESTAEDUARDO CUESTA
EDUARDO CUESTA
Joaquín GarcíaJoaquín García
Joaquín García
Braulio Jose AlvarezBraulio Jose Alvarez
Braulio Jose Alvarez

1 December 2010 in Optics and Lasers in Engineering
Verified
Journal Article
Closed access
SMSusana Martínez-Pellitero
Susana Martínez-Pellitero
EDUARDO CUESTAEDUARDO CUESTA
EDUARDO CUESTA
Joaquín GarcíaJoaquín García
Joaquín García
Braulio Jose AlvarezBraulio Jose Alvarez
Braulio Jose Alvarez

18 December 2019 in Sensors
Verified
Journal Article
Open access
PDF file
David BlancoDavid Blanco
David Blanco
PÁPedro Fernández Álvarez
Pedro Fernández Álvarez
ANAlvaro Noriega
Alvaro Noriega
Braulio Jose AlvarezBraulio Jose Alvarez
Braulio Jose Alvarez
GVGonzalo Valiño
Gonzalo Valiño
Industrial adoption of additive manufacturing (AM) processes demands improvement in the geometrical accuracy of manufactured parts. One key achievement would be to ensure that manufactured layer contours match the correspondent theoretical profiles, which would require integration of on-machine measurement devices capable of digitizing individual layers. Flatbed scanners should be considered as serious candidates, since they can achieve high scanning speeds at low prices. Nevertheless, image deformation phenomena reduce their suitability as two-dimensional verification devices. In this work, the possibilities of using flatbed scanners for AM contour verification are investigated. Image distortion errors are characterized and discussed and special attention is paid to the plication effect caused by contact imaging sensor (CIS) scanners. To compensate this phenomena, a new local distortion adjustment (LDA) method is proposed and its distortion correction capabilities are evaluated upon actual layer contours manufactured on a fused filament fabrication (FFF) machine. This proposed method is also compared to conventional global distortion adjustment (GDA). Results reveal quasi-systematic deformations of the images which could be minimized by means of distortion correction. Nevertheless, the irregular nature of such a distortion and the superposition of different errors penalize the use of GDA, to the point that it should not be used with CIS scanners. Conclusions indicate that LDA-based correction would enable the use of flatbed scanners in AM for on-machine verification tasks.

6 December 2007 in The International Journal of Advanced Manufacturing Technology
Verified
Journal Article
Closed access
PDF file
PÁPedro Fernández Álvarez
Pedro Fernández Álvarez
CRCarlos Rico
Carlos Rico
Braulio Jose AlvarezBraulio Jose Alvarez
Braulio Jose Alvarez
GVGonzalo Valiño
Gonzalo Valiño
SMSabino Mateos
Sabino Mateos

1 October 2019 in Optics and Lasers in Engineering
Verified
Journal Article
Closed access
ECE. Cuesta
E. Cuesta
Braulio Jose AlvarezBraulio Jose Alvarez
Braulio Jose Alvarez
SMSusana Martínez-Pellitero
Susana Martínez-Pellitero
JBJ. Barreiro
J. Barreiro
HPH. Patiño
H. Patiño