This paper proposes the implementation of an assisting technology to a processing/reprocessing mechatronics line (P/RML), comprising the following: two autonomous robotic systems (ARSs), two robotic manipulators (RMs) and three visual servoing systems (VSSs). The P/RML has four line-shaped workstations assisted by two ARSs—wheeled mobile robots (WMRs): one of them equipped with an RM, used for manipulation, and the other one used for transport. Two types of VSSs—eye to hand and eye in hand—are used as actuators for precise positioning of RMs to catch and release the work-piece. The work-piece visits stations successively as it is moved along the line for processing. If the processed piece does not pass the quality test, it is taken from the last stations of the P/RML and it is transported to the first station where it will be considered for reprocessing. The P/RML, assisted by ARSs, RMs and VSSs, was modelled with the synchronized hybrid Petri nets (SHPN). To control the ARSs, we propose the use of trajectory-tracking and sliding-mode control (TTSMC). The precise positioning that allows the picking up and releasing of the work-piece was performed using two types of VSSs. In the case of the first one, termed eye to hand VSS, the cameras have a fixed position, located at the last and the first workstations of the P/RML. For the second one, named eye in hand VSS, the camera is located at the end effector of the RM.
This article proposes an extended approach to assembly/disassembly mechatronics lines (A/DML) modelling, in terms of service system typologies: autonomous mobile robots, collaborative mobile robots versus mobile robots with parallel action. The A/DML systems served by mobile robots have a specific typology and are modelled by specialized hybrid instruments belonging to Petri Nets class: Timed Petri Nets (TPN), Synchronised Hybrid Petri Nets (SHPN). For the reasons imposed by the production manufacturing management, for transporting components, are used mobile robotic platforms equipped with manipulators, which are dedicated or shared status between production manufacturing lines. The collaborative transport systems meet the specific concepts of shared resources with avoiding collisions while the parallel transport systems are subordinated of synchronized actions concepts. This paper focuses on SHPN models and off-line simulation results for the state, boundedness, viability and possible deadlock of process analysis. Task planning is used to identify synchronous events of SHPN model, the last one being useful for implementing of real-time control.
1 April 2018 in The Scientific Bulletin of Electrical Engineering Faculty
The microscopy images can be affected by periodic noise, resulting in quality degradation and the appearance of repetitive patterns on the micrograph. In order to effectively remove the periodic noise, a new adaptive method is proposed in this paper. The presented approach analyzes the frequency domain of the first order Haar Wavelet transform, determines the frequency regions that correspond to noise and corrects the magnitude spectrum components of the undecomposed DFT transform of the image. Experimental results are provided.
Complementary laser scanning microscopy micrographs are considered as pairs consisting in a master image (MI) and a slave image (SI), the latter with potential for facilitating the interpretation of the MI. We propose a strategy based on reversible watermarking for embedding a lossy compressed version of the SI into the MI. The use of reversible watermarking ensures the exact recovery of the host image. By storing and/or transmitting the watermarked MI in a single file, the information contained in both images that constitute the pair is made available to a potential end-user, which simplifies data association and transfer. Examples are presented using support images collected by two complementary techniques, confocal scanning laser microscopy and transmission laser scanning microscopy, on Hematoxylin and Eosin stained tissue fragments. A strategy for minimizing the watermarking distortions of the MI, while preserving the content of the SI, is discussed in detail.