Joachim Jonuscheit

Dr. Joachim Jonuscheit

Fraunhofer Institute for Industrial Mathematics ITWM, Kaiserslautern, Germany

Research Focus & Metrics

Academic Career Length

24Years (2003-Present)

(Calculated once Scilit publication data is synced: current year − year of first publication + 1)

Representative Publications

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8 January 2018 in Photonics
Verified
Journal Article
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Fabian FriederichFabian Friederich
Fabian Friederich
KMKarl Henrik May
Karl Henrik May
BBBessem Baccouche
Bessem Baccouche
CMCarsten Matheis
Carsten Matheis
Maris BauerMaris Bauer
Maris Bauer
NSNick Savage
Nick Savage
Radomes protecting sensitive radar, navigational, and communications equipment of, e.g., aircraft, are strongly exposed to the environment and have to withstand harsh weather conditions and potential impacts. Besides their significance to the structural integrity of the radomes, it is often crucial to optimize the composite structures for best possible radio performance. Hence, there exists a significant interest in non-destructive testing techniques, which can be used for defect inspection of radomes in field use as well as for quality inspection during the manufacturing process. Contactless millimeter-wave and terahertz imaging techniques provide millimeter resolution and have the potential to address both application scenarios. We report on our development of a three-dimensional (3D) terahertz imaging system for radome inspection during industrial manufacturing processes. The system was designed for operation within a machining center for radome manufacturing. It simultaneously gathers terahertz depth information in adjacent frequency ranges, from 70 to 110 GHz and from 110 to 170 GHz by combining two frequency modulated continuous-wave terahertz sensing units into a single measurement device. Results from spiraliform image acquisition of a radome test sample demonstrate the successful integration of the measurement system.

30 September 2021 in Sensors
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Maris BauerMaris Bauer
Maris Bauer
RHRaphael Hussung
Raphael Hussung
CMCarsten Matheis
Carsten Matheis
HRHermann Reichert
Hermann Reichert
PWPeter Weichenberger
Peter Weichenberger
Fabian FriederichFabian Friederich
Fabian Friederich
We present a rotational terahertz imaging system for inline nondestructive testing (NDT) of press sleeves for the paper industry during fabrication. Press sleeves often consist of polyurethane (PU) which is deposited by rotational molding on metal barrels and its outer surface mechanically processed in several milling steps afterwards. Due to a stabilizing polyester fiber mesh inlay, small defects can form on the sleeve’s backside already during the initial molding, however, they cannot be visually inspected until the whole production processes is completed. We have developed a fast-scanning frequenc-modulated continuous wave (FMCW) terahertz imaging system, which can be integrated into the manufacturing process to yield high resolution images of the press sleeves and therefore can help to visualize hidden structural defects at an early stage of fabrication. This can save valuable time and resources during the production process. Our terahertz system can record images at 0.3 and 0.5 THz and we achieve data acquisition rates of at least 20 kHz, exploiting the fast rotational speed of the barrels during production to yield sub-millimeter image resolution. The potential of automated defect recognition by a simple machine learning approach for anomaly detection is also demonstrated and discussed.

13 May 2022 in Applied Sciences
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Journal Article
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DMDaniel Molter
Daniel Molter
KEKim-Sophie Ellenberger
Kim-Sophie Ellenberger
JKJens Klier
Jens Klier
SDStefan Duran
Stefan Duran
Joachim JonuscheitJoachim Jonuscheit
Joachim Jonuscheit
ADAnselm Deninger
Anselm Deninger
The acquisition speed of terahertz time-domain spectroscopy systems has undergone a significant improvement in recent years. With the development of dual-laser-based sampling techniques such as ASOPS or ECOPS, waveform acquisition rates in the kilohertz range have become feasible. Here, we present measurements of sub-wavelength layers in multilayer systems at a rate of 1.6 kHz, where the individual layer thicknesses are analyzed in real time. For demonstration, we image layers on metallic and non-metallic disks with a 300 mm diameter, acquiring 240,000 pixels in only 2.5 min. By combining a rotation of the samples with a linear translation of the measurement head, we maximize the measurement yield. Owing to a “single-shot” (625 µs) dynamic range of 40 dB and a bandwidth above 3 THz of the ECOPS system, we achieve sub-micron repeatability for each layer.

27 April 2021 in Applied Physics Reviews
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Journal Article
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DMDaniel Molter
Daniel Molter
JKJ. Klier
J. Klier
SWS. Weber
S. Weber
MKM. Kolano
M. Kolano
Joachim JonuscheitJoachim Jonuscheit
Joachim Jonuscheit
GFGeorg von Freymann
Georg von Freymann
Terahertz cross-correlation spectroscopy enables phase-sensitive measurements without the need for a laser source and, hence, presents a cost-efficient and versatile alternative to common terahertz time-domain spectroscopy approaches. This review article presents the development of this technique over the past two decades as well as applications of this approach. It is completed by a detailed mathematical description proving the irrelevance of the optical phases of the employed pump light modes. Numerical investigations of the resulting signal demonstrate the applicability and are compared to state-of-the-art measurements. Terahertz cross-correlation spectroscopy is a valuable alternative for moderate-demand applications already. Further possible improvements are discussed.

1 December 2003 in Journal of Molecular Structure
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Journal Article
Closed access
Thomas SeegerThomas Seeger
Thomas Seeger
Joachim JonuscheitJoachim Jonuscheit
Joachim Jonuscheit
MSMartin Schenk
Martin Schenk
ALAlfred Leipertz
Alfred Leipertz

12 February 2009
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Conference Paper
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SWS Wohnsiedler
S Wohnsiedler
MTMichael Theuer
Michael Theuer
MHMichael Herrmann
Michael Herrmann
SIShany Islam
Shany Islam
Joachim JonuscheitJoachim Jonuscheit
Joachim Jonuscheit
FHF Hase
F Hase
Terahertz (THz) spectroscopy is a promising technique for the stand-off detection and characterization of hidden objects. The THz band is particularly well suited firstly because THz radiation penetrates many dielectrics like clothes and secondly because many potentially hazardous substances have characteristic signatures in the THz spectral region. In order to utilize the full potential of THz radiation for detecting possible hazards and recognizing characteristic signatures, disturbing influences must be accounted for. We have performed experiments and simulations in order to investigate the limits of terahertz stand-off detection. A special emphasis is paid on humidity in ambient air and properties of the sample like surface roughness, alignment and interfaces. Water vapor absorption strongly affects the THz spectra. Since the absorption lines are strong and narrow, the calculation must be precise. We have checked various models well-known in meteorology covering the infrared and the microwave region of the electromagnetic spectrum. By extending the models into the THz region, an accurate description of the measured spectral absorption is achieved. In our studies transmission spectra for different substances were tested. In a reflection scheme metallized sandpaper of various grit sizes was used to determine the influences of different surface properties. Further measurements were performed for different tilt angles to analyze the influence of the surface roughness. We are currently creating a look-up table to show which parts of the THz spectrum can be used for THz stand-off detection.