Y6 is a new type of non-fullerene acceptor, which has led to power conversion efficiencies of single-junction polymer solar cells over 17% when combined with a careful choice of polymeric donors. However, the excited state characteristics of Y6, which is closely correlated with its opto-electronic applications, are not clear yet. In this work, we studied the excited state properties of the Y6 solution and Y6 film, by using steady-state and time-resolved spectroscopies as well as time-dependent density functional theory (TD-DFT) calculations. UV-Vis absorption and fluorescence simulation, natural transition orbitals (NTOs) and hole-electron distribution analysis of Y6 solution were performed for understanding the excitation properties of Y6 by using TD-DFT calculations. The lifetimes of the lowest singlet excited state in Y6 solution and film were estimated to be 0.98 and 0.8 ns, respectively. Combining the exciton lifetime and photoluminescence (PL) quantum yield, the intrinsic radiative decay lifetimes of Y6 in the solution and film were estimated, which were 1.3 and 10.5 ns for the Y6 solution and film, respectively. Long exciton lifetime (~0.8 ns) and intrinsic radiative decay lifetime (~10.5 ns) of Y6 film enable Y6 to be a good acceptor material for the application of polymer solar cells.

Sb₂Se₃ has recently emerged as a promising material for optic-electronic applications. In this work, trapped carrier recombination in Sb₂Se₃ was investigated by joint use of time-resolved microwave conductivity (TRMC) and photoluminescence (PL) spectroscopy. trapped carrier thermal excitation into the continuous band was observed in TRMC kinetics. Based on the exponential band tail model, the depth of the trap state, where trapped carriers are released into a continuous band, was estimated to range from 33.0 meV to 110.0 meV at room temperature. Temperature-varying TRMC and PL were further employed to study the influence of temperature on the trapped carrier recombination. Negative thermal quenchings of PL intensity and quantity of thermal emission carriers were observed and can be well explained by the thermal excitation of deep trapped carriers into shallow trap states and the continuous band. Two thermal activation energies of 12.5 meV and 304.0 meV were also revealed. This work is helpful for understanding the trapped carrier recombination process in polycrystalline Sb₂Se₃ film.